SPECIAL NOTICE
66 -- Atomic Force Microscope - Sources Sought
- Notice Date
- 10/11/2019
- Notice Type
- Special Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of the Air Force, Direct Reporting Units, USAF Academy - 10 CONS, 8110 Industrial Drive, Suite 200, USAF Academy, Colorado, 80840-2315, United States
- ZIP Code
- 80840-2315
- Solicitation Number
- FA7000A004617
- Archive Date
- 11/2/2019
- Point of Contact
- Melissa A. Staudacher, Phone: 719.333.4504, Ryan A. Mavis, Phone: 719.333.8265
- E-Mail Address
-
melissa.staudacher@us.af.mil, ryan.mavis.2@us.af.mil
(melissa.staudacher@us.af.mil, ryan.mavis.2@us.af.mil)
- Small Business Set-Aside
- N/A
- Description
- Sources Sought: Atomic Force Microscope SOURCES SOUGHT FROM: 10th Contracting Squadron, United States Air Force Academy (USAFA), CO SUBJECT: Sources Sought 1. The USAF Academy 10th Contracting Squadron is requesting information from potential providers of an Atomic Force Microscope (AFM). The North American Industry Classification System Code (NAICS) is 3334516 and the small business size standard in number of employees is 1,000. 2. Interested contractors whether potential prime contractors or interested potential subcontractors are encouraged to review the salient characteristics in paragraph 5 to gain an understanding of the requirement and provide feedback and questions to the contracting specialist. 3. This notice is also issued for the purpose of market research in accordance with Federal Acquisition Regulation (FAR) Part 10. All responsible contractors interested in providing this product and who have the potential to provide this product are invited to respond. Any information provided by industry to the Government as a result of this notice is voluntary. This notice is for planning purposes only and the Government will not pay for any information provided. If you are not interested and/or able to provide this product no response is necessary. The result of this market research will contribute to determining the method of procurement. This sources sought announcement is not to be construed as a commitment by the Government, implied or otherwise, to issue a solicitation or to award a contract. 4. The purpose of this notice is to identify capable and qualified companies to provide an Atomic Force Microscope (AFM) with the stated specifications to the U.S. Air Force Academy. All businesses capable of providing an Atomic Force Microscope (AFM) are invited to respond. Interested small business vendors must reference their 8(a), HUB Zone, Women-owned, or Service Disabled Veteran status, if applicable. A firm fixed price contract is anticipated to be awarded. 5. All interested and qualified sources should submit the following documentation to this office by e-mail to melissa.staudacher@us.af.mil no later than 1:00 PM MST, 18 October 2019: a. Name of Company and Address, Point of Contact, Phone Number, E-mail Address, Website (if applicable) b. Representation/Certification of small business socioeconomic status c. CAGE code and DUNS Number d. Atomic Force Microscope (AFM) meeting the following salient characteristics: • Support sample size up to 100mm x 100mm, 20mm thickness. • Fully decoupled movement of XY and Z flexure scanners in closed-loop. • Out-of-plane movement of XY scanner: less than 2 nm vertical movement over 40 µm XY scan. • Mechanical orthogonality deviation of XY scan: less than 0.3°. • Mechanical orthogonality deviation of XY-Z scan: less than 1°. • High feedback speed using fast Z scanner (resonant frequency: > 9 kHz). • 15 um Z scanner with noise floor of less than 0.05 nm when XY scan range is set to zero. • Height signal (Z-detector position) noise is less than 0.05 nm at 1kHz bandwidth. • Motorized XY stage with at least 20mm x 20mm travel range. • Motorized Z stage with at least 22mm travel. • SLD (Super luminescence diode, 830 nm) for minimized interference noise on cantilever deflection detection. Laser diode introducing interference noise is not acceptable. • Pre-aligned kinematic (magnetic) quick-change tip mount. • Automated, fast and soft cantilever approach within 10 seconds at more than 1mm away from sample surface while preserving the same amplitude-distance approach curve. • SmartScan automated non-contact imaging mode. • Standard System Modes - True "Non-Contact Mode", Contact Mode, Lateral Force Mode (LFM), AC Mode (Tapping), Phase Imaging, Force Modulation Mode (FMM), Force Distance Spectroscopy, Force Volume Imaging, Pinpoint NanoMechanical Mode (topography, stiffness and adhesion force maps are acquired simultaneously in real-time from high speed force-distance curves). • Standard System Modes with purchase of starter kit - Electric Force Mode (EFM), Scanning Kelvin Probe Mode (SKPM), Piezoelectric Force Mode (PFM), Magnetic Force Mode (MFM) and NanoIndentation Mode. • Capable of True Non-Contact Mode, performing over 500 images using a single tip on hard disk glass substrate without image degradation. • Compatible with Pinpoint Nano-mechanical Mode that can acquire stiffness, adhesion, and young's modulus at the same time acquiring AFM topography. Either indentation depth or indentation force can be used as the force limit. • Standard System Modes with purchase of starter kit - MFM, Enhanced EFM (PFM and SKPM), FMM, and Nano-indentation. • SKPM in Standard System Modes can be obtained in single pass. • Fully capable research system that can incorporate advanced AFM modes of SCM, Conductive AFM, and SThM as options. • 3 fully integrated, lock-in amplifiers. 6. All interested and qualified sources should also submit the answers to the following questions to this office by e-mail to melissa.staudacher@us.af.mil no later than 1:00 PM MST, 18 October 2019: a. How long have you been in business? b. Have you provided this item in the past? c. Are you the manufacturer or distributor of the item? d. What is your lead-time for delivery? e. Have you ever performed Government contracts? f. What are your payment/discount terms? Do you offer an educational and/or military discount to universities? g. If you require different terms and conditions than those normally used by the Government, what are your commercial terms and conditions? Please feel free to provide a copy of your terms and conditions for this type of work. h. Where is the Atomic Force Microscope (AFM) manufactured? i. Where are the components manufactured? j. What is your estimated cost for this requirement? You will not be held to this price, it is only for market research purposes. k. Are design, analysis, documentation, or any other items, included? l. Is the product Buy American compliant IAW DFARS 252.225-7001? m. Is the product considered commercially available off-the-shelf IAW FAR 2.101 and FAR 12.103? If not, is the product considered commercial? n. Do you offer/allow trade-in discounts? 7. THIS IS NOT A SOLICITATION FOR OFFERS OR A REQUEST FOR PROPOSAL. DO NOT SUBMIT PROPOSALS AT THIS TIME. 8. Any questions regarding this notice can be directed in writing via email to the following points of contact. To promote maximum competition and clarity, all questions and responses regarding this requirement will be posted via amendment to this notice. Contracting Officer, Mr. Ryan Mavis Contract Specialist, Melissa Staudacher Email: ryan.mavis.2@us.af.mil Email: melissa.staudacher@us.af.mil
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/USAF/DRU/10ABWLGC/FA7000A004617/listing.html)
- Place of Performance
- Address: US Air Force Academy, Colorado Springs, Colorado, 80840, United States
- Zip Code: 80840
- Zip Code: 80840
- Record
- SN05473959-W 20191013/191011230046-5ff6e81b624bc3046688d44dc0f354e9 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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