SAMDaily.us | SRCSGT | 99 | Atomic Force Microscope platform with large sample stage and electrical scanned probe modes

SAMDAILY.US - ISSUE OF FEBRUARY 29, 2020 SAM #6666
SOURCES SOUGHT

99 -- Atomic Force Microscope platform with large sample stage and electrical scanned probe modes

Notice Date: 2/27/2020 7:16:15 AM
Notice Type: Sources Sought
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
ZIP Code: 20899
Solicitation Number: AMD-SS20-12
Response Due: 3/6/2020 11:00:00 AM
Archive Date: 03/21/2020
Point of Contact: Sedigah Gizabi, Phone: 3019758249, Patrick J. Grother, Phone: 3019756335
E-Mail Address: sedigah.gizabi@nist.gov, patrick.grother@nist.gov
(sedigah.gizabi@nist.gov, patrick.grother@nist.gov)
Description: Atomic Force Microscope platform with large sample stage and electrical scanned probe modes
Web Link: SAM.gov Permalink
(https://beta.sam.gov/opp/1e3c07c45ce14cae941341c7dc530c52/view)
Place of Performance: Address: Gaithersburg, MD 20899, USA; Zip Code: 20899; Country: USA
Record: SN05575036-F 20200229/200227230144 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

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