SAMDaily.us | SNOTE | H | Atomic Force Microscope Platform with Large Sample Stage and Electrical Scanned Probe Modes

SAMDAILY.US - ISSUE OF MAY 08, 2020 SAM #6735
SPECIAL NOTICE

H -- Atomic Force Microscope Platform with Large Sample Stage and Electrical Scanned Probe Modes

Notice Date: 5/6/2020 2:03:22 PM
Notice Type: Special Notice
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
ZIP Code: 20899
Solicitation Number: AMD-NOI-AFM
Response Due: 5/20/2020 11:00:00 AM
Archive Date: 06/04/2020
Point of Contact: Sedigah Gizabi, Phone: 3019758249, Adam C. Powell, Phone: 3019752166
E-Mail Address: sedigah.gizabi@nist.gov, adam.powell@nist.gov
(sedigah.gizabi@nist.gov, adam.powell@nist.gov)
Description: Notice of Intent for�Atomic Force Microscope Platform with Large Sample Stage and Electrical Scanned Probe Modes
Web Link: SAM.gov Permalink
(https://beta.sam.gov/opp/15b5829529544c40bf41eb809a5a9fc5/view)
Place of Performance: Address: Gaithersburg, MD 20899, USA; Zip Code: 20899; Country: USA
Record: SN05647451-F 20200508/200506230157 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

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