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SAMDAILY.US - ISSUE OF FEBRUARY 03, 2021 SAM #7006
SOURCES SOUGHT

66 -- Atomic Force Microscope capable of providing images in the following modes: non-contact (also called AC or tapping mode), contact mode, lateral force microscopy mode, force modulation mode, force spectroscopy mode and lithography mode.

Notice Date
2/1/2021 5:32:05 AM
 
Notice Type
Sources Sought
 
NAICS
334516 — Analytical Laboratory Instrument Manufacturing
 
Contracting Office
W6QK ACC-APG ADELPHI ADELPHI MD 20783-1197 USA
 
ZIP Code
20783-1197
 
Solicitation Number
W911QX21Q0053
 
Response Due
2/8/2021 8:59:00 AM
 
Archive Date
02/23/2021
 
Point of Contact
Adrian Barber, Phone: 3013941503
 
E-Mail Address
adrian.t.barber.civ@mail.mil
(adrian.t.barber.civ@mail.mil)
 
Description
A. Objective: To find sources that are qualified to meet the supplies/services as listed in section 11B. Note that the specific requirements in section C are subject to change prior to the release of any solicitation. B. Salient Characteristics: The contractor shall deliver one (1) atomic force microscope system to Aberdeen Proving Ground (APG) that meets the following requirements: Capable of a minimum X-Y scan range of 100 micrometers by 100 micrometers. Capable of a minimum Z range of 10 micrometers with closed loop Z control. Capable of tapping mode (also called non-contact mode or dynamic force mode) imaging with phase contrast mode. Capable of contact mode (also called static force) imaging. Capable of lateral force mode operation. Capable of magnetic force microscopy measurements. Capable of force-distance spectroscopy measurements. Capable of imaging in fluids including water and mineral oil. X-Y stage capable of accommodating samples that are at least 20 millimeters by 20 millimeters in area and up 4 millimeters in height. Stage must be capable of movement in the X and Y directions. Active or passive vibration isolation must be provided. �Integrated camera that provides a top view of the cantilever and sample surface �Computer and software necessary to operate the atomic force microscope in all the modes mentioned above and perform image analysis, particularly quantification of surface roughness. Software and hardware must allow for calibration of cantilever spring constants and quality factor calculation. �Installation of the system at Aberdeen Proving Ground, MD along with training (minimum of one day) C. Responses: � All interested parties should notify this office in writing, mail, fax, or e-mail within the posted date.� Responses shall include: To what extent each of the specifications can be met. � �Include your type of business (i.e. commercial, academia), whether your organization is classified as a large or small business based on the 1,000 Employee standard that accompanies NAICS code [334516]. If a small business, you must also list any small disadvantaged status you hold [HUBZone, 8(a), Service Disabled Veteran Owned Small Business (SDVOSB), Women Owned Small Business (WOSB), Economically Disadvantaged Women-Owned Small Business (EDWOSB), etc.]. � Past experience/ performance through the description of completed projects. � (12) Responses to this sources sought are due no later than 11:59 am eastern standard time 2/08/2021. Submissions should be emailed to Adrian Barber adrian.t.barber.civ@mail.mil. �� � Questions concerning this sources sought may be directed to Adrian Barber at adrian.t.barber.civ@mail.mil. Please be advised that .zip and .exe files cannot be accepted.
 
Web Link
SAM.gov Permalink
(https://beta.sam.gov/opp/b95d97032df747a3be943d036003384e/view)
 
Place of Performance
Address: Aberdeen Proving Ground, MD 21005, USA
Zip Code: 21005
Country: USA
 
Record
SN05905393-F 20210203/210201230121 (samdaily.us)
 
Source
SAM.gov Link to This Notice
(may not be valid after Archive Date)

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