SPECIAL NOTICE
66 -- Notice of Intent to Sole Source - Optical Components for Generating and Steering Ultraviolet Light
- Notice Date
- 3/22/2021 9:27:54 AM
- Notice Type
- Special Notice
- NAICS
- 333314
— Optical Instrument and Lens Manufacturing
- Contracting Office
- DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
- ZIP Code
- 20899
- Solicitation Number
- NB683130-21-01111
- Response Due
- 4/5/2021 9:00:00 AM
- Archive Date
- 04/20/2021
- Point of Contact
- Joni L. Laster, Phone: 3019756205, Joni L. Laster, Phone: 3019756205
- E-Mail Address
-
joni.laster@nist.gov, joni.laster@nist.gov
(joni.laster@nist.gov, joni.laster@nist.gov)
- Description
- The United States Department of Commerce (DOC), National Institute of Standards and Technology (NIST), Acquisition Management Division (AMD) intends to negotiate a firm fixed price purchase order, on a sole source basis, with Applied Physics & Electronics, Inc., for the purchase of Optical Components to Generate and Guide Ultraviolet Light for the Physical Measurements Laboratory (PML). The statutory authority for this sole source acquisition is FAR 13.106-1(b) by the authority of FAR Part 13 Simplified Acquisition Procedures. The National Institute of Standards and Technology (NIST), Nanoscale Device Characterization Division (NDCD) develops and advances the measurement and knowledge infrastructure to characterize nano- and atom-scale engineered materials and solid-state devices for innovation in information processing, sensing, and future quantum technologies. The NDCD�s technical activities span atom scale devices, nanoscale spectroscopy, nanoscale imaging, nanoscale processes and measurements, and alternative computing. To meet mission requirements, the NDCD needs to procure optical components that are compatible with a high, repetition rate, ultrafast Ti:saphhire laser system and these optical components will generate deep ultraviolet (UV) light, pick pulses, and guide the ultraviolet light from the optical table to an electron microscope system. This acquisition will allow the division to expand its photoemission electron microscopy (PEEM) metrology capabilities. To advance the PEEM metrology capabilities, the ability to generate ultraviolet light from a high repetition rate, ultrafast Ti:sapphire laser system is required. Ultraviolet light from a visible laser source is commonly generated using harmonic generation by frequency mixing multiples of the laser output. A high repetition rate system is critical for PEEM-based measurements to avoid distortion from space charge effects, however, there are some measurements where lowering repetition rate will be necessary. This can be achieved with an optical component called a pulse picker to tune down the repetition rate. In PEEM imaging, the light-based excitation source is used to excite and eject electrons from a specimen. Because of this, the light has a maximum wavelength for this process to occur and therefore the requirement of light must be in the ultraviolet regime. A spectrometer is necessary to measure the wavelength of the generated ultraviolet light that will be used for experiments within the PEEM. The ultraviolet light generated by the laser system will have to be guided to the PEEM where it retains its intensity, beam spot, and other optical properties and this will be designed and implemented by the contractor. All items must be compatible with a high power, high repetition rate, ultrafast Ti:sapphire laser system and output of the deep ultraviolet light guided to the PEEM for use. The Government has performed extensive market research and has concluded that only Applied Physics & Electronics, Inc has the capability to meet all the Governments minimum requirements for a complete system which shall include the following: (1) harmonics generation box, (1) pulse selecting accessory, (1) spectrometer, and (1) UV beam guidance that meet the following minimum specifications: 1.�������� The Harmonics Generation Box a.�������� Must be compatible with a mode-locked Ti:sapphire laser system as the fundamental wavelength (?) from 760 nm - 920 nm that outputs a power of 3.5 W at 800 nm, pulse width ����������� between 100 fs � 150 fs, maximum repetition rate of 80 MHz b.�������� Must generate and output the fourth harmonic (4?) by frequency mixing the 3? and 1? light. c.�������� Must generate third harmonic (3?) light d.�������� Must generate output fourth harmonic (4?) generated light in the tunable range between 195nm and 210 nm. e.�������� Must have some optical alignment procedures that are motorized and software controlled to optimize output in the UV (4?). Stronger consideration shall be given for more automation procedures provided f.��������� Must provide parameter (e.g., crystal angle and delay positions) for optimizing 4? (3? + ?) generation g.�������� Must have minimum conversion efficiency of 0.05% in the 4th harmonic (using 3? + ?) resulting �������� in 2.2 x 107 photons per pulse or 1.75 mW at the 4? with a laser system output power 3.5 W at ���� 800 nm, pulse width 150 fs, repetition rate of 80 MHz. h.�������� Must have 4? spectral output bandwidth no greater than 20 meV i.��������� Must have 4? output beam quality M2 less than 1.2 j.��������� Must provide access to the output of 2nd harmonic (2?) generated light k.�������� Must provide access to the output of 3rd harmonic (3?) generated light l.��������� Must provide any power supply for any necessary component and powered by 120 VAC at 60 Hz m.������� Optical components must be self-contained in one housing unit not exceeding dimensions of 410 mm (width) by 590 mm (length) by 240 mm (height). n.�������� The Contractor shall provide operations and maintenance manual (electronic or hard copy) that includes, at a minimum, proper operation, routine maintenance, troubleshooting the instrument, and controlling software. 2.�������� Pulse Selecting Accessory a.�������� Must be compatible with a mode-locked Ti:sapphire laser system as the fundamental wavelength (?) from 760 nm - 920 nm that outputs a power of 3.5 W at 800 nm, pulse width ����������� between 100 fs � 150 fs, maximum repetition rate of 80 MHz b.�������� Must be able to continuously output repetition rate of 80/n MHz where n is an integer between2 and 260,000 c.�������� Must be able to select repetition rate with an interfaced controller d.�������� Must select pulses using acousto-optical-based methods e.�������� Must provide any power supply for any necessary component and powered by 120 VAC at 60 Hz f.��������� Optical components must be self-contained in one housing unit not exceeding dimensions of 300 mm (width) by 400 mm (length) by 240 mm (height). g.�������� The Contractor shall provide operations and maintenance manual (electronic or hard copy) that includes, at a minimum, proper operation, routine maintenance, troubleshooting the����������� instrument. 3.�������� Spectrometer a.�������� Must be compatible with a laser system that outputs a power of 3.5 W at 800 nm, pulse width between 100 fs � 150 fs, repetition rate of 80 MHz b.�������� Must be able to measure between wavelength range 200 nm � 900 nm. � c.�������� Must have a spectral resolution of 0.2 nm or smaller d.�������� Must have a scan rate of 5 Hz or faster e.�������� Must be able to accept free-space laser beam as input f.��������� Must include connection by USB for computer communication g.�������� Must include software to perform measurement and collect data h.�������� All optical components are self-contained in one housing unit no larger than 400 mm (length) by 150 mm (width) by 100 mm (height) i.��������� Must provide any power supply for any necessary component and powered by 120 VAC at 60 Hz j.��������� The Contractor shall provide operations and maintenance manual (electronic or hard copy) that ��������������� includes, at a minimum, proper operation, routine maintenance, troubleshooting the instrument, and controlling software. 4.�������� UV Beam Guidance a.�������� The contractor shall provide beam routing, including necessary optics and appropriate enclosure, from output 4? beam from the harmonics box to the NIST-owned PEEM vacuum chamber to meet light spot size within PEEM stage i.��������� The contractor shall provide (2) beam routing paths 1.�������� Path 1: through air (200 cm) and through vacuum (45 cm) 2.�������� Path 2: through air (265 cm) and through vacuum (16 cm) ii.�������� The spot size on the sample inside the NIST-owned PEEM will have user selected, variable spot size between 250 - 500 ?m b.�������� will have to be guided to the PEEM where it retains its intensity, beam spot, and other optical ����� properties and this will be designed and implemented by the contractor c.�������� The Contractor shall provide operations and maintenance manual (electronic or hard copy) that includes, at a minimum, proper operation, routine maintenance, troubleshooting of the routing optics and enclosure 5.�������� The full system a.�������� Must provide a cooling system to any previously listed component that requires it�� Applied Physics & Electronics, Inc., is the only manufacturer that has been identified as capable of providing all the necessary components that are able to meet all of the minimum requirements. Therefore, they uniquely qualified to meet the Governments minimum requirements. The North American Industry Classification System (NAICS) code for this acquisition is 333314 and the size standard is 500 employees. No solicitation package will be issued. This notice of intent is not a request for competitive quotations; however, all responsible sources interested may identify their interest and capability to respond to this requirement. The Government will consider responses received by 12:00 p.m. Eastern on April 5, 2021. Inquiries will only be accepted via email to �joni.laster@nist.gov . No telephone requests will be honored. A determination by the Government not to compete the proposed acquisition based upon responses to this notice is solely within the discretion of the Government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement in the future.
- Web Link
-
SAM.gov Permalink
(https://beta.sam.gov/opp/730ae50f48814078bc07b2954418e90e/view)
- Place of Performance
- Address: Gaithersburg, MD 20899, USA
- Zip Code: 20899
- Country: USA
- Zip Code: 20899
- Record
- SN05949362-F 20210324/210322230109 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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