SAMDaily.us | AWARD | 66 | Synopsis of Award - One (1) Premium High Vacuum and Environmental Control Atomic Force Microscope (AFM/SPM) & critical add-on components.

SAMDAILY.US - ISSUE OF JULY 25, 2021 SAM #7176
AWARD

66 -- Synopsis of Award - One (1) Premium High Vacuum and Environmental Control Atomic Force Microscope (AFM/SPM) & critical add-on components.

Notice Date: 7/23/2021 8:20:38 AM
Notice Type: Award Notice
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: W6QK ACC-APG ADELPHI ADELPHI MD 20783-1197 USA
ZIP Code: 20783-1197
Solicitation Number: W911QX-21-C-0027
Archive Date: 08/06/2021
Point of Contact: William Nuamah, Phone: 3013940755
E-Mail Address: william.nuamah.civ@mail.mil
(william.nuamah.civ@mail.mil)
Award Number: W911QX-21-C-0027
Award Date: 07/22/2021
Awardee: HITACHI HIGH-TECH AMERICA, INC. Dallas TX USA
Award Amount: 348150.00
Description: Synopsis of Award -�One (1) Premium High Vacuum and Environmental Control Atomic Force Microscope (AFM/SPM) & critical add-on components. Note: See attached Synopsis of Award document.
Web Link: SAM.gov Permalink
(https://beta.sam.gov/opp/71ee1c025933429c99fafb3117e2829b/view)
Place of Performance: Address: Adelphi, MD 20783, USA; Zip Code: 20783; Country: USA
Record: SN06071452-F 20210725/210723230112 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

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