SOURCES SOUGHT
66 -- Spectral Bidirectional Scattering Distribution Function (BSDF) Instrument
- Notice Date
- 1/31/2022 12:04:14 PM
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
- ZIP Code
- 20899
- Solicitation Number
- AMD-SS22-10
- Response Due
- 2/14/2022 8:59:00 PM
- Point of Contact
- Tracy M Retterer, Forest Crumpler
- E-Mail Address
-
tracy.bisson@nist.gov, forest.crumpler@nist.gov
(tracy.bisson@nist.gov, forest.crumpler@nist.gov)
- Description
- This is a Sources Sought Notice ONLY. Requests for copies of a solicitation will not receive a response.� This Notice is for planning purposes only and is not a Request for Proposal or Request for Quotation or an obligation on the part of the NIST for conducting a follow-on acquisition.� NIST does not intend to award a contract on the basis of this Notice, or otherwise pay for the information requested.� No entitlement or payment of direct or indirect costs or charges by NIST will arise as a result of submission of responses to this Notice and NIST�s use of such information.� NIST recognizes that proprietary components, interfaces and equipment, and clearly mark restricted or proprietary components, interfaces and equipment, and clearly mark restricted or proprietary data and present it as an addendum to the non-restricted/non-proprietary information.� In the absence of such identification, NIST will assume to have unlimited rights to all technical data provided in the response. � NO SOLICITATION DOCUMENTS EXIST AT THIS TIME. � NIST is seeking information from sources that are capable of providing one (1) spectral BSDF instrument Summary of Requirements: The National Institute of Standards and Technology (NIST) Surface and Interface Metrology Group of the Sensor Science Division, National Institute of Standards and Technology performs calibrations, measurement services and research related to the optical directional reflectance and transmittance of materials. As part of that work, we are building a database of the spectral bidirectional scattering distribution functions (BSDFs) of a wide variety of materials and require a new instrument to acquire data for the database. The BSDF is a general measure of the angle-dependent reflectance and transmittance of a material. While NIST has existing research facilities for BSDF measurements (see ROSI and GOSI), a new commercial-grade instrument is required to measure a wide range of materials and populate the BSDF database. NIST requires the purchase of one spectral BSDF instrument (also called a scatterometer) to measure the spectral (mid-ultraviolet to short-wavelength infrared) BSDF of a wide variety of materials including solid materials, films, powders, and liquids. This instrument will help the sensor science division meet its mission to advance the measurement science of the optical properties of materials by enabling NIST to measure the BSDF of a diverse array of materials. Upon publication in the BSDF database, these measurements will directly support the aerospace, remote sensing, and healthcare industries by providing trusted and traceable data for optical models. The system shall meet or exceed the minimum requirements identified below. All items must be new.� Used or remanufactured equipment will not be considered for award. Experimental, prototype, or custom items will not be considered.� The use of �gray market� components not authorized for sale in the U.S. by the Contractor is not acceptable.�� All line items shall be shipped in the original manufacturer�s packaging and include all original documentation and software, when applicable. The Contractor shall provide the following spectral BSDF instrument (quantity 1) that meets the following minimum specifications: The instrument shall perform absolute BSDF measurements (as opposed to relative BSDF measurements). The BSDF measurement shall be made in an �underfilled� mode there the incident light illuminates a portion of the sample, as opposed to an �overfilled� mode where the entire sample is illuminated by the incident light. Light sources, both laser-based and lamp-based, shall be able to be installed and replaced by NIST. One single-wavelength laser light source shall be included with the BSDF instrument. This laser shall emit light at a wavelength in the visible spectrum (400 nm to 700 nm). The instrument�s wavelength range shall cover 200 nm to 2400 nm when used with appropriate third-party illumination sources, such as a supercontinuum laser and a xenon laser-driven lamp. The Contractor shall install one supercontinuum laser illumination source provided by NIST and one xenon laser-driven lamp illumination source provided by NIST. The optical path of the incident beam shall be accessible and modifiable such that optical elements like monochromators, filters and polarizers can be added by NIST. The instrument shall offer automated control of a NIST-supplied filter wheel to perform wavelength band selection. Detectors for different wavelength ranges shall be able to be interchanged by NIST. There shall be automated control of the linear polarization state of the incident light. The sample being measured shall mount horizontally in order to accommodate powder and liquid samples without needing a cover or sealed chamber. The instrument shall monitor the relative power of the light source during data collection (often called a reference measurement) and use this measurement to correct for fluctuations in incident light power during data collection. The incident beam diameter at the sample shall be less than or equal to 10 mm. There shall be automated control of polar angle of incident of the light, ?i, automated or manual control of azimuthal incident angle, ?i, automated control of polar detection angle, ?d, and automated control of azimuthal detection angle, ?i��(see Figure 1 for angle definitions, below). Each angle of incidence and detection shall be controlled independently. Measurements at all combinations of polar and azimuthal incident angles on one side of the sample with ?i�less than or equal to 85� shall be achievable. Measurements at all combinations of polar and azimuthal detection angles on both sides of the sample (for reflection and transmission measurements) shall be achievable with the exception of retroreflection angles where the detection and incident angles are within 5� of overlapping each other. The instrument shall have an angular accuracy less than or equal to 0.1� in ?i, ?i, ?d, and ?d. When used with illumination powers equal to or less than 10 mW, the instrument shall have a noise equivalent BSDF of 10-5 sr-1 or less at all wavelengths in the range of 200 nm to 2400 nm, and 10-7 sr-1 or smaller at wavelengths in the range of 400 nm to 1000 nm. A noise equivalent BSDF of 10-5 sr-1 or less is required for high signal-to-noise measurements of dark diffuse surfaces (for example black coated surfaces), which can have BSDF values smaller than 10-3 sr-1. A noise equivalent BSDF of 10-7 sr-1 or less is required for high signal-to-noise measurements of polished optical surfaces (such as laser mirrors and lenses), which can have BSDF values less than 10-5 sr-1 in off-specular directions. The noise equivalent BSDF must be met with 10 mW or less of illumination power because that is the nominal power (with a 10 nm bandwidth) of the broadband light sources that will be used with the BSDF instrument. The instrument shall accommodate samples with thicknesses equal to or less than 25.4 mm, lengths equal to or less than 152.4 mm, and widths equal to or less than 152.4 mm. The instrument shall be controlled via computer software. Data collection at different incident and detection angles, filter-wheel-based wavelength selection of broadband sources, and incident polarization direction shall be controlled and automated in software. The instrument shall include a computer to control it. The instrument�s software source code shall be provided with documentation which enables NIST to program custom data collection routines. The instrument shall operate on 120V for all components. The instrument shall include all necessary power supplies, cables, adapters, etc. for normal operation. An installation and user manual shall be included with the instrument which fully describes proper set-up, installation, and usage. NIST is seeking responses from all responsible business sources to include small businesses AND U.S. manufactured items. Small businesses are defined under the size standard of 1,000 employees associated with the applicable NAICS code, 334516 - Analytical Laboratory Instrument Manufacturing. Please include company�s size classification and socio-economic status in any response to this notice. Interested parties shall describe the capabilities of their organization as it relates to the requirements described herein.� Businesses able to provide the requested equipment are directed to email a detailed response describing their capabilities to tracy.bisson@nist.gov no later than the response date for this source sought notice. The report shall include any information relevant to the organization�s capabilities to meet the requirements detailed in Summary of Requirements. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of company/companies that are authorized provide product, their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Number of days, after receipt of order that is typical for delivery of product. 4. Indication of whether the product is currently on one or more GSA Federal Supply Schedule contracts or any other government-wide contracts. If so, please provide the applicable contract number(s). 5. Indication of whether the product proposed is a commercial item, currently offered in the market place.� 6. Interested vendors shall address their capability of providing Original Equipment Manufacturer (OEM) parts. 7. Any other relevant information that is not listed above which the Government should consider in developing its minimum performance requirements. Responses are limited to a total of twelve (12) pages in MS Word or PDF format. NIST invites all interested vendors to submit any questions or comments regarding the Draft Summary of Requirements via email to tracy.bisson@nist.gov within 3 calendar days of the posting of this notice. NIST intends to then post an amendment providing responses to any questions received. Official responses to the Sources Sought Notice shall be submitted by February 14 ,2022 at 11:59 pm EST.
- Web Link
-
SAM.gov Permalink
(https://sam.gov/opp/1da134e82a9b453585396941edd3c680/view)
- Place of Performance
- Address: Gaithersburg, MD 20899, USA
- Zip Code: 20899
- Country: USA
- Zip Code: 20899
- Record
- SN06229154-F 20220202/220131230111 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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