Loren Data's SAM Daily™

SAMDAILY.US - ISSUE OF AUGUST 06, 2022 SAM #7554
SOLICITATION NOTICE

66 -- JEOL JSM IT800HL

Notice Date

8/4/2022 7:42:03 AM
 

Notice Type

Combined Synopsis/Solicitation
 

NAICS

334516 — Analytical Laboratory Instrument Manufacturing
 

Contracting Office

NASA IT PROCUREMENT OFFICE Greenbelt MD 20771 USA
 

ZIP Code

20771
 

Solicitation Number

80TECH22Q0029
 

Response Due

8/10/2022 9:00:00 AM
 

Archive Date

08/10/2022
 

Point of Contact

Michelle Downs, Learon Comeaux
 

E-Mail Address

michelle.m.downs@nasa.gov, learon.j.comeaux@nasa.gov
(michelle.m.downs@nasa.gov, learon.j.comeaux@nasa.gov)
 

Description

This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. Solicitation number 80TECH22Q0029 is issued as a request for quotes (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular 2022-05. The associated NAICS code is 334516 (Analytical Laboratory Instrument Manufacturing)). This acquisition is for the following Contract Line-Item Number (CLIN) identified below: CLIN 0001 JSM-IT800(HL). Specifications: See attached Attachment A: Statement of Work document. The National Aeronautics and Space Administration (NASA) Kennedy Space Center�s Exploration System & Development Office requires a Scanning Electron Microscope (SEM) which will replace an obsolete SEM that is used to support work at the NASA Kennedy Space Center. The SEM will process samples in the Applied Chemistry Lab. The SEM is a widely used instrumental method for the examination of micro and nano particles. The specifications shall meet the following requirements: RESOLUTION AND SPOT SIZE: The secondary electron resolution shall be: 0.7nm at 20kV guaranteed 1.3nm at 1kV guaranteed 3.0nm at 15kV (EDS WD), 5nA probe current guaranteed Guaranteed values are demonstrable at the customer site. A plot of probe size vs. kV vs. probe current is provided for 1kV and 15kV. MAGNIFICATION: The magnification range shall be 10X to 2,000,000X (128x96 mm photo) The display magnification range shall be 27X to 5,480,000X (1280x960 pixels photo) The magnification shall be microprocessor linked to changes in kV and WD Any magnification can be preset and instantly recalled. ACCELERATING VOLTAGE: The kV shall be variable from 0.01kV (10 Volts) to 30kV with 10V steps. PROBE CURRENT: Probe current of >300 nA should be ac ELECTRON GUN: The electron source shall consist of a Schottky type thermal field emission gun. The emitter shall be a Zr/O tungsten tip with up to 100uA emission. The gun shall be positioned in the field of the first condenser lens to maximize the current generated into the probe. The anode must be of conical design to minimize image shift and gun alignment when changing accelerating voltage. A battery backup power supply shall be standard and eliminate the need for gun bake-out and realignment even after an extender power outage. Emitter shall be guaranteed for 3 years and fully covered under the normal service contract, with typical lifetime of the gun expected to be over 6 yrs. AUTOMATION: The microscope shall employ an auto-alignment correcting procedure that automatically presents all the lens parameters for ultimate imaging and analytical performance. Lens control and alignment should be optimized by NeoEngine. Auto alignment, auto stig, auto brightness/contrast and auto focus should be available at any accelerating voltage and beam current. LENS SYSTEM: The lens system shall consist of a zoom condenser lens to allow changes in beam current with minimal focus change, coupled with an aperture angle control lens (ACL) to minimize system Cs and optimize the convergence angle to ensure optimum performance at all beam currents. The ACL shall be computer controlled and fully automatic to provide the smallest probe diameter at low beam currents (largest optimum alpha angle) and the optimum probe geometry for high resolution analytical performance at high beam currents (smallest optimum alpha angle). The beam current delivered to the sample shall range continuously between 300nA.The objective lens (OL) aperture strip shall contain four externally selectable, X/Y alignable apertures plus an open position. The apertures should be in the front focal plane, so as to maintain the optimum spot size as a function of beam current. The objective lens shall be highly conical so as to allow high tilt at short WD. The OL shall be a hybrid type lens with both electrostatic and electromagnetic components for ultra-high-resolution imaging with beam acceleration and deceleration within the lens to reduce aberration and improve probe diameter. The in-column detectors must not reside within the OL field but be placed above the lens outside the lens field. There must be no OL electromagnetic leakage flux below the lens allowing imaging of magnetic or paramagnetic samples at short working distance and preventing pattern distortion while doing EBSD. There shall be a lens setting for ultra-long depth of field. It should be possible to perform both EDS and WDS with a take-off-angle of >30� at the analytical WD. It must be possible to add an automated Faraday cup into the column just below the objective lens aperture (without altering the column length) for the purpose of measuring the probe current with readout in the GUI. A port for an optionally available beam blanking system shall be provided and be located in the column just below the OL aperture assembly. It should be automated to provide either beam blanking or beam current monitoring (Faraday cup). This electrostatic blanker should have a rise time of less than 10ns. The column shall have an acoustic dampening coating. ELECTRON DETECTOR SYSTEM: Standard Detectors must include: SED (Secondary Electron Detector) - A secondary electron detector system consisting of an in the chamber E-T type detector shall be standard. The user shall have control of the collector cage voltage in a minimum of 5 steps for both SE and BSE imaging. UED (Upper Electron Detector) - A through the lens detector with a user controllable energy filter for collection of topographic (SE) contrast or atomic number (BSE) contrast shall be standard. STEM (Scanning Transmission Detection) � The microscope should be capable of producing STEM images utilizing a STEM converter holder which should be included as standard with the system. The STEM imaging resolution should be 0.6 nm (attainable). Optionally Available Detectors must include: SRBED (Short Working Distance Retractable Solid State BSE Detector) - The backscattered electron detector must be a pneumatically retractable (from the GUI) solid state design that does not block SE signal or limit the collection of X-Rays and allows a working distance as short 2.0 mm when inserted. This detector shall produce pure compositional images with a resolution of 0.1Z at Z=29 and be operational at or below 1kV. USD (Upper Secondary Detector) - A dedicated in column low energy SE detector STEM (Transmission Electron Detector) � The chamber must be capable of accepting a dedicated STEM detector (either a scintillator/photomultiplier BF/DF transmission electron detector or a solid-state BF/DF). All of the above detectors must be capable of being installed simultaneously. It shall be possible to image with up to four of these detectors simultaneously It shall be possible to mix in real time up to four of these detectors. SPECIMEN STAGE: The sample stage shall be a large goniometer with mechanically fully eucentric tilt at all Z positions. Stage movement should be at least 70mm in X, 50mm in Y and 41mm in Z (larger stage is available). The stage shall be eucentric at all Z positions and tilts. The tilt range must be -5� to +70� with the tilt axis perpendicular to dedicated EDS and EBSD Ports. All 5 stage Axes (X, Y, R, T, Z) shall be motorized and automated and include computer eucentric rotation. The stage shall be capable of meeting all resolution specifications without a stage lock or clamp. The combination of specimen chamber design and objective lens shape must be optimized for an analytical geometry of the sample at 0� Tilt at 10mm WD with an EDS take off angle not less than 30�. The chamber must also be capable of accommodating multiple EDS detectors simultaneously and accommodating EDS, WDS, and EBSD simultaneously. The EDS and EBSD detectors shall be co planar. The stage tilt shall be perpendicular to the dedicated EBSD port. The sample substage shall be electrically isolated and a sample current feed thru shall be provided to measure absorbed current (or true probe current when a Faraday cup is mounted on the sample holder). The stage shall be capable of having a bias voltage of up to 2kV. Beam deceleration shall be able to be applied at any gun accelerating voltage. The stage automation system shall be controlled through mouse control and trackball and allow the following functions: a. Computer eucentric rotation b. Continuous movement with the speed linked to magnification. c. Mouse drag and drop movement d. Snapshot image capture for sample survey (up to four images) e. Step distance defined by user f. Field by field with user defined % overlap. g. Click center and zoom h. Points table and on-screen graphics i. Hard limits and soft limits linked to sample holder and user input of sample height offset. j. Stage return to location of any stored image. Stage navigation system (Optional): Should be available for both draw-out stage and airlock mounting. Automatically acquires optical image of the specimen during specimen exchange and allows seamless transition and navigation from optical to SEM image for a given location (Zeromag). SPECIMEN EXCHANGE AIRLOCK (OPTIONAL) An optional specimen airlock shall be available to allow up to 4� wide or 2-inch-tall samples to be loaded with a cycle time of less than 60 seconds. The sample loading procedure shall require a single movement, be fail-safe and not require observation of the sample stage. The load lock shall be pumped to appropriate vacuum via vacuum gauge reading and not a timer. The airlock door shall open automatically upon reaching vacuum and shall remain part of the high vacuum region. There shall be an indicator showing the presence or absence of a specimen on the stage both on the airlock and on the software GUI. The airlock shall have 3 ports for installation of options such as an integrated color navigation camera, oxygen radical cleaner or environmentally isolated specimen holder. There shall also be an audible alarm if the air lock rod is activated while the stage is not at the exchange position. LOW VACUUM OPERATION (OPTIONAL) There must be an optionally available capability to operate the SEM in Low Vacuum Mode. The pressure in the specimen chamber shall be up to 300Pa. The system shall consist of a differential pumping orifice which can be removed automatically via software control under vacuum without the need to vent the chamber or remove the sample. There shall be a low-profile solid state BSE detector mounted to the bottom orifice which is also retracted when the orifice is removed. The orifice and BSE assembly must not block SE or X-ray signal collection. The in-situ removal of the LV orifice allows for >300 nA of beam current in high vacuum mode. The system shall also support an optionally available, integrated low vacuum secondary electron detector.� LV operation shall be integrated into the GUI. N2 gas shall be used as the low vacuum backfill to maintain cleanliness and guarantee long term low kV performance. Low Vacuum Resolution: 1.3nm at 30 kV (10Pa) COMPUTER CONTROL SYSTEM: All microscope functions shall be controlled through a Windows 10 PC based interface. This system should reside on a Xeon processor and be operated from a minimum 24-inch color wide screen format flat panel display with a pixel display resolution of at least 1920 x 1080. The control graphical user interface (GUI) shall be easy to understand and use. The operation of the electron optics system shall be computer aided, so that a minimum of fine tuning is required even when changing accelerating voltages. This system shall also allow the following functions: a. Image archiving and data base management with thumbnail display, search capability, montaging, percent area phase analysis, image filtration and kernel operators and a customizable report generator b. Network interfacing c. EDS integration (No additional hardware or software required on SEM) d. Image processing e. Mouse, keyboard, trackball and knob control operation f. Image annotation with changeable fonts, colors and special characters. The on-screen scalar measurement and annotation system must include point-to-point, angles and lines, X and Y cursors including diagonal measurement, circle, square, arrow, line and text, calibration routine for standards. Annotation can be saved, loaded and appended g. Automated beam alignment h. A password protected master column and gun alignment with overriding user adjustments i. No additional or optional software or hardware shall be required on the microscope to allow full control via 3rd party accessories such as EDS, WDS, and EBSD Image acquisition functions such as frame averaging, frame integration pixel integration, Charge Free scan function, and pixel binning shall be built into the computer control system. Auto functions such as Auto-Focus, Auto-Stigmation and Auto-Exposure shall also be included as part of the NeoEngine. Stage automation shall include features such as eucentric rotation (about any point on the sample), snapshot sample review, click to center, and a programmable move by field or defined absolute amount button. The operation system shall have both standard �recipes� of common operating conditions for standard sample types as well as user created recipes for custom applications which can be stored and recalled. DIGITAL SCAN GENERATOR / IMAGING: The digital scan generator shall be capable of high-speed scanning and image acquisition of up to 7680 X 5760 pixels. The live image shall be displayed on the display at 800 X 600 or 1280 X 960-pixel resolution. The system must allow for image acquisition at 8- or 16-bit resolution. Movie recording capability should be standard. The system shall provide for user selectable image acquisition parameters including time per frame, slow scan acquisition, frame averaging, frame integration, block integration mode (charge reduction mode). The system shall include a digital scan rotation feature that automatically corrects for accelerating voltage and working distance and any user entered angle of scan rotation to maintain orthogonal motion on the display. The imaging software shall include dynamic focus to maintain focus on steeply tilted specimens. Image display modes should include normal display, full screen display, user defined reduced raster, live horizontal or vertical split screen, live quad image display, signal mixing of up to 4 live signals (with individual live display simultaneously), dual color for mixed signals, pseudo color, and anaglyph stereo. REMOTE VIEWING AND REMOTE CONTROL The SEM as configured shall be capable of live remote viewing and live external remote control of SEM operation via a standard high-speed internet connection. MISCELLANEOUS The system shall operate on a 100V 40 Amp circuit. The console shall have an emergency power off (EPO) switch mounted on the front of the instrument. There shall be a low energy consumption mode (sleep mode) to reduce electrical cost during standby. The SEM must allow installation of an optionally available, integrated and imbedded real time active feedback anti vibration system that must not be an external table. INSTALLATION AND TRAINING The system shall include installation start up training and proof of resolution at customer�s facility. A one-year warranty of all parts and labor for the FE SEM shall be standard. A two-day application training for 1 person at JEOL facility. Unlimited technical support from trained applications specialists shall be available for the life of the instrument. The equipment needs to be shipped to JEOL JSM-IT800(HL), 3rd Street (Central Supply Facility M6-744), NASA Kennedy Space Center, FL 32899-0001. The Government anticipates award of a Firm Fixed Price contract. Quoters responding to this announcement shall submit their quote in accordance with Enclosure 2: FAR 52.212-1. Submission of quote shall include the following: (1) Technical Specifications and (2) Price (to include shipping). All responses shall be submitted electronically to michelle.m.downs@nasa.gov and cc: learon.j.comeaux@nasa.gov . The basis for the award is the lowest price technically acceptable (LPTA).� LPTA means the best value is expected to result from the selection of the technically acceptable proposal with the lowest evaluated price.� Pursuant to FAR 52.212-2, the criteria for evaluation are (1) Technical Specifications and (2) Price.� The lowest-priced proposal will first be evaluated for technical acceptability in accordance with the minimum specifications identified and the earliest delivery date.� If determined not technically acceptable, it will be removed from competition and the next lowest priced proposal will be evaluated for technical acceptability.� This will continue until the lowest-priced quote is determined technically acceptable.� Once the lowest priced proposal is determined technically acceptable, then a determination of responsibility will be completed.� If found responsible, evaluations will be closed, and the award will be made.� The Offeror shall comply with FAR 52.212-3 Offeror Representations and Certifications�Commercial Products and Commercial Services Found in Enclosure 2.� The Offeror shall comply with FAR 52.212-4 Contract Terms and Conditions�Commercial Products and Commercial Services found in Enclosure 1.� The Offeror shall comply with FAR 52.212-5 Contract Terms and Conditions Required To Implement Statutes or Executive Orders�Commercial Products and Commercial Services found in Enclosure 1.� INSPECTON AND ACCEPTANCE TERMS:� Supplies will be inspected by the Technical Point of Contact and accepted at the destination.� Delivery is requested no later than August 26, 2022.� The applicable provisions and clauses that apply to this acquisition are included in the attached solicitation document.� To be eligible for an award, all contractors must be registered in the System for Award Management (SAM).� A contractor can contact SAM by calling 1-866-606-8220 or e-mail at www.sam.gov.� NO EXCEPTIONS. A DUNS (Dun and Bradstreet) number is required in order to register.� All invoices shall be submitted electronically via the Invoice Processing Platform (IPP). Quotes must be received no later than 12:00 PM Eastern Daylight Time on August 10, 2022.� Questions regarding this combined synopsis/solicitation are due no later than 12:00 PM Eastern Daylight Time August 8, 2022.� Answers to any questions received by that time will be posted as an amendment to this combined synopsis/solicitation.�
 

Web Link

SAM.gov Permalink
(https://sam.gov/opp/44a04bc96104470a808f45b2f5a09341/view)
 

Place of Performance

Address: FL 32899, USA

Zip Code: 32899

Country: USA
 

Record

SN06415124-F 20220806/220804230114 (samdaily.us)
 

Source

SAM.gov Link to This Notice
(may not be valid after Archive Date)

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