SAM#7628
66 - Instruments and Laboratory Equipment
SAMDaily.us: SOURCES SOUGHT - October 19, 2022
- NIST-SS23-CHIPS-0019 - Sources Sought
MECHANICAL CLAMP BASED SINGLE WAFER DEEP SILICON ETCHER
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0018 - Sources Sought
INDUCTIVELY COUPLED PLASMA REACTIVE ION ETCHER FOR ETCHING SILICON WITH HYDROGEN BROMIDE AND CHLORINE
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0017 - Sources Sought
ELECTRICAL STATIC CHUCK BASED SINGLE WAFER DEEP SILICON ETCHER
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0016 - Sources Sought
INDUCTIVELY COUPLED PLASMA CRYO-CAPABLE REACTIVE ION ETCHER FOR ETCHING SILICON AND DIELECTRIC MATERIALS
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0015 - Sources Sought
BATCH OPEN-LOAD REACTIVE ION ETCHER FOR SILICON AND SILICON-BASED DIELECTRICS
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0014 - Sources Sought
INDUCTIVELY COUPLED PLASMA REACTIVE ION ETCHER FOR ETCHING METAL, SILICON, AND III-V COMPOUNDS
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0013 - Sources Sought
TIME-RESOLVED SCANNING/TRANSMISSION ELECTRON MICROSCOPE (S/TEM)
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0012 - Sources Sought
HIGH-RESOLUTION 100 KEV ELECTRON BEAM LITHOGRAPHY SYSTEM
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0011 - Sources Sought
AUTOMATED SINGLE SUBSTRATE RESIST DEVELOP AND CHROME ETCH SYSTEM
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0010 - Sources Sought
MASK WRITER
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0009 - Sources Sought
DICING SAW
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0008 - Sources Sought
WAFER BONDER AND LITHOGRAPHY ALIGNER SYSTEM
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0007 - Sources Sought
FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM)
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0006 - Sources Sought
X-RAY DIFFRACTOMETER (XRD)
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-00 - Sources Sought
SEMICONDUCTOR FURNACES (FURNACE BANKS)
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
- NIST-SS23-CHIPS-0004 - Sources Sought
ATOMIC FORCE MICROSCOPE/SCANNING PROBE MICROSCOPE (AFM/SPM)
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, DEPT OF COMMERCE NIST, GAITHERSBURG, MD 20899 USA
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