SAMDaily.us | SRCSGT | 66 | Suite of Scanning Electron and Focused Ion Beam Microscopes

SAMDAILY.US - ISSUE OF OCTOBER 26, 2022 SAM #7635
SOURCES SOUGHT

66 -- Suite of Scanning Electron and Focused Ion Beam Microscopes

Notice Date: 10/24/2022 2:08:06 PM
Notice Type: Sources Sought
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
ZIP Code: 20899
Solicitation Number: NIST-SS23-CHIPS-0025
Response Due: 11/23/2022 9:00:00 AM
Point of Contact: Forest Crumpler, Tracy Retterer
E-Mail Address: forest.crumpler@nist.gov, Tracy.retterer@nist.gov
(forest.crumpler@nist.gov, Tracy.retterer@nist.gov)
Description: THIS IS A SOURCES SOUGHT NOTICE PLEASE SEE ATTACHMENT�NIST-SS23-CHIPS-0025 AND APPLICABLE PDF�Focused Ion Beam Lab Layout (81-1C109).pdf FOR COMPLETE NOTICE DETAILS ...�
Web Link: SAM.gov Permalink
(https://sam.gov/opp/7a07f47ce56c413d9f424d6b007e35ec/view)
Place of Performance: Address: Boulder, CO 80305, USA; Zip Code: 80305; Country: USA
Record: SN06501464-F 20221026/221024230100 (samdaily.us)
Source: SAM.gov Link to This Notice
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