SAMDaily.us | SRCSGT | 99 | Cryogenic Electron Microscopy Focused Ion Beam Suite

SAMDAILY.US - ISSUE OF DECEMBER 02, 2022 SAM #7672
SOURCES SOUGHT

99 -- Cryogenic Electron Microscopy Focused Ion Beam Suite

Notice Date: 11/30/2022 9:03:22 AM
Notice Type: Sources Sought
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: ALLIANCE SUSTAINABLE ENRGY-DOECONTR Golden CO 80402 USA
ZIP Code: 80402
Solicitation Number: SS-2023-2018
Response Due: 12/14/2022 4:00:00 PM
Archive Date: 12/14/2022
Point of Contact: Katherine Jungjohann
E-Mail Address: katherine.jungjohann@nrel.gov
(katherine.jungjohann@nrel.gov)
Description: NREL is seeking information from sources that may be capable of providing a commercial solution for the cryogenic electron microscopy FIB suite will be installed and operated within the Microscopy and Imaging Sciences group at NREL, in support of many projects and materials development across the entire laboratory. These tools will be operated by microscopy experts to support a growing base of qualified users on the tools. Samples vary from semiconductor devices, heterogenous devices, metals, polymers, electrodes, perovskites, and stacked combinations with and without electrolytes.
Web Link: SAM.gov Permalink
(https://sam.gov/opp/20f2cfd89d26425a8fc8e1dbda9fcaba/view)
Place of Performance: Address: Golden, CO 80401, USA; Zip Code: 80401; Country: USA
Record: SN06531945-F 20221202/221130230117 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

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