MODIFICATION
66 -- Focused Ion Beam Scanning Electron Microscopes
- Notice Date
- 4/10/2023 12:05:31 PM
- Notice Type
- Combined Synopsis/Solicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
- ZIP Code
- 20899
- Solicitation Number
- NB100000-23-00586
- Response Due
- 5/16/2023 7:00:00 AM
- Archive Date
- 05/31/2023
- Point of Contact
- Ian Robinson, Don Collie
- E-Mail Address
-
ian.robinson@nist.gov, donald.collie@nist.gov
(ian.robinson@nist.gov, donald.collie@nist.gov)
- Description
- This is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. The solicitation is being issued using simplified acquisition procedures for certain commercial items under the authority of FAR 13.5. The solicitation number is NB100000-23-00586 and this solicitation is a Request for Quotation (RFQ). This acquisition is being solicited as full and open. The NIST Center for Nanoscale Science and Technology (CNST) has a requirement for one (1) Gallium ion (Ga+) source focused ion beam scanning electron microscope (Ga+ FIB) system and one (1) Xenon (Xe) plasma source focused ion beam scanning electron microscope (Xe PFIB) to support nanofabrication research and development.� SEE ATTACHED RFQ AND STATEMENT OF WORK FOR DETAIL AND QUOTE SUBMISSION INSTRUCTIONS.
- Web Link
-
SAM.gov Permalink
(https://sam.gov/opp/bc7e5caa9a8c4d3e94e1da548dc4c088/view)
- Place of Performance
- Address: Gaithersburg, MD 20899, USA
- Zip Code: 20899
- Country: USA
- Zip Code: 20899
- Record
- SN06645370-F 20230412/230410230108 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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