Loren Data's SAM Daily™

SAMDAILY.US - ISSUE OF MAY 12, 2023 SAM #7836
SPECIAL NOTICE

66 -- Request for Information (RFI) - Seeking feedback on Draft Requirements for Suite of Analytical Transmission Electron Microscopes (TEMs)

Notice Date

5/10/2023 7:45:17 AM
 

Notice Type

Special Notice
 

NAICS

334516 — Analytical Laboratory Instrument Manufacturing
 

Contracting Office

DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
 

ZIP Code

20899
 

Solicitation Number

NIST-RFI23-CHIPS-Suite_of_TEMs
 

Response Due

5/24/2023 8:00:00 AM
 

Point of Contact

Nina Lin
 

E-Mail Address

nina.lin@nist.gov
(nina.lin@nist.gov)
 

Description

1.�� �Request for Information (RFI) � � �1.1.�� �General Information for this RFI � � � � � � 1.1.1.�� �No solicitation exists; therefore, do not request a copy of the solicitation. If a solicitation is released it will be synopsized in the SAM.gov. It is the responsibility of potential offerors/bidders to monitor the SAM.gov site for the release of any solicitation or synopsis. � � � � � � �1.1.2.�� �Although all comments received will be carefully reviewed and considered for inclusion in any possible later action, the initiators of this request make no commitment to include any particular recommendations. Respondents will not be notified of the results of the review. � � � � � � 1.1.3.�� �The Government is seeking information and responses from any and all potential sources. The Government is interested in feedback on draft requirements documents and potential Technical Proposal submission items. � � � � � � 1.1.4.�� �Responses to this RFI must be submitted no later than 11:00 AM EST, on May 24, 2023. RFI submissions will be accepted as email attachments only. All responses must be sent to Nina Lin at nina.lin@nist.gov with �Suite of TEMs RFI Response� in the subject line. 2.�� �Background � � � 2.1.�� �The National Institute of Standards and Technology (NIST) is investigating the procurement of one high-resolution aberration corrected scanning transmission electron microscope (STEM) instrument and one high-throughput transmission electron microscope (TEM) instrument. In order to ensure compatibility of accessories and reduce the training and maintenance burden on NIST staff, NIST requires that both instruments be from the same instrument manufacturer. � � � �2.2.�� �The purposes of this RFI are to: � � � � � � 2.2.1.�� �Determine whether any offerors can meet all the technical specifications as laid out in the draft statement of work and determine whether any technical specifications are unduly restrictive.� � � � � � � 2.2.2.�� �Determine whether proposed documentation to be submitted with any future proposals are reasonable and realistic. 3.�� �NIST is seeking responses to the following: � � � 3.1.�� �Is the attached Draft Statement of Work (SOW) clear, concise, and realistic? � � � 3.2.�� �Can any potential offerors meet all the technical specifications laid out in the draft SOW? � � � � 3.3.�� �Are any of the specifications unduly restrictive? � � � 3.4.�� �Would requiring the submission of the following images as a part of the Technical Proposal for CLIN 0001 of the attached draft SOW be feasible? � � � � � � 3.4.1.�� �A scanning transmission electron microscope (STEM) image and a transmission electron microscope (TEM) image demonstrating the maximum spatial resolution of the microscope when operated at an accelerating voltage of 300 kV � � � � � � 3.4.2.�� �A STEM image and TEM image demonstrating the maximum spatial resolution of the microscope when operated at the minimum available accelerating voltage � � � � � � 3.4.3.�� �An electron energy loss (EEL) spectrum of the zero loss peak demonstrating the maximum energy resolution of the cold field emission electron source � � � � � � 3.4.4.�� �An EEL spectrum of titanium dioxide demonstrating the maximum energy resolution of the cold field emission electron source � � � � � � 3.4.5.�� �An energy dispersive x-ray spectroscopy (EDS) map demonstrating atomic resolution chemical imaging of a material with the perovskite crystal structure � � � � � � 3.4.6.�� �STEM images and nanobeam diffraction pattern(s) of adjacent nanocrystalline grains or particles, preferably with a crystal size of less than 5 nanometers � � � 3.5.�� �How much time (in calendar days) is required to provide a comprehensive Technical Proposal, including the images required in section 3.4? � 4.�� �Attachments: � � � 4.1.�� �Draft Statement of Work (SOW)
 

Web Link

SAM.gov Permalink
(https://sam.gov/opp/6ee41fc9b3844c718c60b7451a5b6713/view)
 

Place of Performance

Address: Boulder, CO 80305, USA

Zip Code: 80305

Country: USA
 

Record

SN06677725-F 20230512/230510230110 (samdaily.us)
 

Source

SAM.gov Link to This Notice
(may not be valid after Archive Date)

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