AWARD
66 -- 66--Rigaku Miniflex 6G 6th Gen Benchtop X-ray Diffract
- Notice Date
- 8/10/2023 11:49:54 AM
- Notice Type
- Award Notice
- Contracting Office
- IBC ACQ SVCS DIRECTORATE (00004) HERNDON VA 20170 USA
- ZIP Code
- 20170
- Solicitation Number
- 140D0423Q0655
- Archive Date
- 08/19/2023
- Point of Contact
- Gregar, Jamie, Phone: 0000000000
- E-Mail Address
-
jamie_gregar@ibc.doi.gov
(jamie_gregar@ibc.doi.gov)
- Award Number
- 140D0423P0201
- Award Date
- 08/04/2023
- Awardee
- GOVERNMENT SCIENTIFIC SOURCE INC 12355 SUNRISE VALLEY DR STE 400 RESTON VA 20191-3497 US
- Award Amount
- 117832.04
- Description
- A nondestructive analytical technique that can determine the elemental and organic composition of powder materials and an X-Ray Diffractometer (XRD) is the primary technique employed for such analyses. The XRD spectrometer/diffractometer is used to analyze sample specimens to determine the chemical composition and crystalline morphology of unknown materials. XRD technology is used in industry and academia as a nondestructive means to accurately determine these properties.
- Web Link
-
SAM.gov Permalink
(https://sam.gov/opp/cbcbae46a70b4efa86f51f5e1cd2f7e8/view)
- Record
- SN06784470-F 20230812/230810230047 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
| FSG Index | This Issue's Index | Today's SAM Daily Index Page |