SOURCES SOUGHT
66 -- NASA Glenn Research Center Scanning Electron Microscope
- Notice Date
- 11/22/2023 8:50:51 AM
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- NASA IT PROCUREMENT OFFICE Greenbelt MD 20771 USA
- ZIP Code
- 20771
- Solicitation Number
- 80TECH24Q0005
- Response Due
- 12/1/2023 2:00:00 PM
- Archive Date
- 12/16/2023
- Point of Contact
- Kavina Patel, Wayne Plummer
- E-Mail Address
-
kavina.patel@nasa.gov, wayne.s.plummer@nasa.gov
(kavina.patel@nasa.gov, wayne.s.plummer@nasa.gov)
- Description
- Nasa Glenn Research Center needs an analytical, high resolution, thermal Schottky type field emission scanning electron microscope (FE-SEM). Both high and low vacuum modes of operation for organic and inorganic sample evaluation, with integrated ESD (Energy-dispersive X-ray spectroscopy), particle analysis Stage large enough to image samples weighing up to 8kg without destruction of samples.� Stage shall accommodate samples up to 100mm in height, and 200mm (or greater) in diameter without the need to remove any stage spacer or rotation module The FE-SEM will be used to evaluate polymer, metal and ceramic materials.� An FE-SEM will allow for high resolution imaging of samples for high-cycle fatigue and reaction zones in high temperature testing and materials development.� Must be capable of remote operation
- Web Link
-
SAM.gov Permalink
(https://sam.gov/opp/645645b8a046494aa52a6a74538d294c/view)
- Place of Performance
- Address: Cleveland, OH 44135, USA
- Zip Code: 44135
- Country: USA
- Zip Code: 44135
- Record
- SN06893045-F 20231124/231122230051 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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