SPECIAL NOTICE
66 -- Notice of Intent to Sole Source, Focus Ion Beam Scanning Electron Microscope
- Notice Date
- 5/13/2024 12:36:40 PM
- Notice Type
- Special Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- W2R2 USA ENGR R AND D CTR VICKSBURG MS 39180-6199 USA
- ZIP Code
- 39180-6199
- Solicitation Number
- W912HZ24N5873
- Response Due
- 5/20/2024 11:00:00 AM
- Archive Date
- 06/04/2024
- Point of Contact
- Janalyn Dement, Allison Hudson
- E-Mail Address
-
Janalyn.H.Dement@usace.army.mil, allison.b.hudson@usace.army.mil
(Janalyn.H.Dement@usace.army.mil, allison.b.hudson@usace.army.mil)
- Description
- The Concrete and Materials Branch (CMB) of the U.S. Army Engineer Research and Development Center (ERDC) Geotechnical and Structures Laboratory (GSL) has a requirement to purchase a Zeiss Focused Ion Beam SEM (FIB-SEM) manufactured by Carl Zeiss Microscopy, LLC (Cage: 325W6) under NAICS Code 334516, Analytical Laboratory Instrument Manufacturing for a new FIB-SEM to perform materials characterization, and to harmonize existing research systems. � GSL�s Concrete and Materials Branch (CMB) serves as USACE�s single point of expertise in concrete and materials-related research, materials testing and in-depth materials analysis. CMB is engaged in ongoing materials research that is supplemented by scanning electron microscopy (SEM) for materials characterization. In support of this research, GSL has obtained a Talos F200x transmission electron microscopy (TEM) that requires a means to prepare samples for analysis. To provide this means, GSL must acquire a Focused Ion Beam SEM (FIB-SEM) for both materials research and for sample preparation for the Talos F200x TEM to ensure the operability of the instrument and to increase the resolution of the data obtained. The new FIB-SEM must be compatible with the existing Zeiss XRM, perform adequate sample preparation for the TEM. The instrument must be able to combine different imaging techniques to enhance quality and reliability of analysis such as correlative microscopy solutions capable of importing 3D volumetric data from uCT/XRM directly into the FIB-SEM software. The new FIB-SEM must be compatible with the existing Zeiss XRM, perform adequate sample preparation for the TEM. Purchasing another SEM from a different company would force a diversion of funding and time that would delay projects in transition to another company�s product. Only a Zeiss FIB-SEM meets the government�s requirement. While several manufacturers produce and distribute FIB-SEMs, only Zeiss can supply a FIB-SEM compatible with the existing Zeiss XRM system. The award will be issued in accordance with FAR 13.500. The applicable North American Industrial Classification System Code (NAICS) code is 334516 (Analytical Laboratory Instrument Manufacturing) with a size standard of 1,000 employees. This notice of intent is for information purposes only.� This notice is not a request for competitive quotes or proposals.� A solicitation will not be issued.� However, all responsible sources may submit a capability statement, proposal, or quotation, which shall be considered by the agency.� Vendors may submit their capabilities and qualifications in writing to Janalyn Dement by email address Janalyn.H.Dement@usace.army.mil AND Allison Hudson by email address Allison.B.Hudson@usace.army.mil by 1:00 PM CST, Monday, 20 May 2024.� Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis.�
- Web Link
-
SAM.gov Permalink
(https://sam.gov/opp/eb3c8c19b35040028105d43f38628679/view)
- Record
- SN07061374-F 20240515/240513230046 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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