SAMDaily.us | PRESOL | 66 | Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument

SAMDAILY.US - ISSUE OF FEBRUARY 11, 2026 SAM #8843
SOLICITATION NOTICE

66 -- Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument

Notice Date: 2/9/2026 1:31:04 PM
Notice Type: Combined Synopsis/Solicitation
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
ZIP Code: 20899
Solicitation Number: 1333ND26QNB030053
Response Due: 2/23/2026 1:30:00 PM
Archive Date: 03/10/2026
Point of Contact: Nina Lin, Forest Crumpler
E-Mail Address: nina.lin@nist.gov, forest.crumpler@nist.gov
(nina.lin@nist.gov, forest.crumpler@nist.gov)
Small Business Set-Aside: NONE No Set aside used
Description: This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.
Web Link: SAM.gov Permalink
(https://sam.gov/workspace/contract/opp/c7581827b97a4646a242778fd96a1049/view)
Place of Performance: Address: Gaithersburg, MD 20899, USA; Zip Code: 20899; Country: USA
Record: SN07710143-F 20260211/260209230042 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

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