NASA Lewis Research Center, 21000 Brookpark Road, Cleveland, Ohio 44135

K -- UPGRADE OF A SCANNING ELECTRON MICROSCOPE EQUIPPED WITH AN X-RAY MICROANALYSIS SOL RFP3-621372 POC John P. Kuminski, Contracting Officer, (216) 433-2453, who may be contacted at Mail Stop 500-305. A Request for Proposal (RFP3-621372) will be issued on a sole-source basis to Topcon International for the purchase of a SEM/EDX upgrade. The Topcon SM-510 SEM equipped with IMG-400-4 Image Processor and DX-4 EDX System will replace the current system at NASA LeRC and is compatible with the detectors and other accessories which NASA LeRC has previously purchased from Topcon International. The purchased system must be compatible with an existing Window/Windowless Secondary Electron Detector and RBSW Robinson Backscattered Electron BSE Detector. The upgrade was manufactured as a direct replacement for the existing system which will be traded in as part of the upgrade. This notice is for information only. Justification to permit contracting with Topcon International has been prepared using citation 10 USC 2304(c)(1), only one responsible source, as its authority. All interested parties may submit information for evaluation of their capabilities to the above name individual prior to the closing date of this synopsis. See Numbered Note(s): 22. (0101)

Loren Data Corp. http://www.ld.com (SYN# 0067 19950412\K-0001.SOL)