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COMMERCE BUSINESS DAILY ISSUE OF JUNE 12,1995 PSA#1365National Institute of Standards and Technology, Acquisition and
Assistance Division, Building 301, Room Bll7, Gaithersburg, MD 20899 66 -- ROLLSCOPE II BASE SYSTEM SOL 52SBNB5C8755 DUE 072195 POC Marsha
Rodgers (301) 975-6339/Contracting Officer: Ruth Ann Maris The
National Institute of Standards and Technology (NIST) has a requirement
for a state-of-the-art portable surface measurement system for use with
in situ characterization of machined surfaces. NIST requires a WYKO
Corporation Rollscope II Base System, Part Number 931- 127 or equal
meeting the following specifications: 1) System shall be able to create
three dimensional topological images of surfaces with at least a 1.22
mm by 0.94 mm field of view with a 10X objective, 2) System shall be PC
compatible, 3) Vertical Scan Range of 500 micrometers, 4) Vertical
Resolution less than 10 nanometers, 5) Pixel Array Size 364 x 239
pixels or greater, 6) Maximum cell density 1000 cells/in., 7) Minimum
cell density 50 cells/in., 8) Measurement time greater than 2
micrometers per second, 9) capability to be converted to a bench-top
microscope--F.O.B. Destination, Gaithersburg, Maryland- -Required
Delivery Time 45 days--All responsible sources may submit a proposal
which shall be considered by the agency--Please submit your request in
writing, Fax Number (301) 963-7732. (0159) Loren Data Corp. http://www.ld.com (SYN# 0260 19950609\66-0008.SOL)
66 - Instruments and Laboratory Equipment Index Page
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