NEW RAC RELIABILITY PUBLICATIONS. The Reliability Analysis Center (RAC), which is sponsored by the Defense Technical Information Center (DTIC) and operated by IIT Research Institute (IITRI) for over 20 years, is the DoD Information Analysis Center (IAC) for the collection, analysis and dissemination of reliability and maintainability data. The RAC is pleased to announce the immediate availability of the following new publications: ``Reliability Toolkit: Commercial Practices Edition'' will help both the commercial and military sectors deal with developing and manufacturing reliable products in a competitive environment. ``Service Life Extension Assessment'' discusses the complex issues associated with system life extension and the process involved in a life extension analysis. ``Benchmarking Commercial Reliability Practices'' provides an understanding of the best R&M practices being used by commercial industry, including the identification of common commercial reliability practices. ``Electrostatic Discharge Susceptibility Data'' includes ESD susceptibility data for 22,000 devices, including microcircuits, discrete semiconductors and resistors. ``EOS/ESD Guidelines'' addresses some of the important issues surrounding microelectronic circuit vulnerability to transient electrical phenomena, while describing sound engineering practices for minimizing the threat. ``Environmental Characterization Device Sourcebook'' provides a compendium of environmental stress measurement devices currently available, including their sensing and storing capabilities, as well as their price and availability. To inquire about these RAC publications, or to obtain a copy of our latest product catalog, please write or call Gina Nash at IIT Research Institute, Reliability Analysis Center, 201 Mill Street, Rome, NY 13440. Phone: (800) 526-4802, e-mail: gnash@mail.iitri.com, Fax: (315) 337-9932.

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