National Institute of Standards and Technology, Acquisition and Assistance Division, Bldg. 301, Room B117, Gaithersburg, MD 20899

66 -- UPGRADE OF X-RAY MICROANALYSIS SYSTEM AND REPAIR OF AN ASSOCIATED LIGHT ELEMENT SOL 52SBNB6C9059 DUE 031196 POC Trena N. Bercaw (301) 975-6324, Pauline E. Mallgrave (301) 975-6330 The National Institute of Standards and Technology (NIST) has a requirement for the repair of its existing Si-Li X-Ray Detector, manufactured by Oxford instruments, and for the upgrade of an x-ray microanalysis system for its JEOL 840 Scanning Electron Microscope. Delivery/Performance is required within 120 days after award of contract. The F.O.B. point for all deliverables shall be Destination, Gaithersburg, Maryland. Because of the necessary compatibility between the X-ray Detector and X-ray Analysis System, it is the intent of the Government to negotiate with Oxford Instruments, Inc., of Concord, MA, the only responsible source that can satisfy the requirements of this agency. No solicitation package is available. Please mail or fax in all inquiries. Fax number (301) 963-7732. See Numbered Note 22. (0025)

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