Defense Electronics Supply Center, 1507 Wilmington Pike, Dayton, OH 45444-5181

99 -- DIGITAL INTEGRATED CIRCUIT TEST SYSTEM SOL SP0910-96-R-0009 DUE 040196 POC Contact: Phone or write DESC-eacb, Attn. S. R. Jones 1507 Wilmington Pike, Dayton, Ohio 45444-5180 phone (513)296-5356 FAX(513)296-8443 please use entire Solicitation number when ordering documents. Failure to do so may result in non receipt or delay in receipt. P PR-NO: S. Rjonespoc, Sharon Jones 513-296-5356. Potential sources sought to supply a digital integrated circuit testsystem, capable of MIL-STD-883, group a: DC, functional, and AC testing. The basic system should be expandable, with a minimum of 128, I/otest INS (tester per pin architecture) and aminimum test frequency of 80 MHZ. The system must be able to support cmos and bi-polar Technologies. The following timing functions should also be included: Programmable input transition time, multiple timingsets, and multiple data formats. The system must benetworkable to a Micro-VAX. Software to include thefollowing: A test Vector translation capability,''shmoo'' plots. I/O graphical timing display, in-testdebut tools & test Vector editing, high and low level user test programming, and DC & functional datalogging. Included with the system will be 4 workstations, capable of ''off line'' program editing and compilation. In addition to the above, the system will include at least 1 pmu (precisionmeasurement unit) and a Handler interface. Sources are requested to submit their responses along with technical Spec Sheets within 15 days after publication of this notice. POC, Attn: DESC/eacb, Sharon Jones, 513-296-5356, 1507 Wilmington Pike, Dayton OH 45444-5180. All responsible sources may submit offer which DESC shall consider(0047)

Loren Data Corp. http://www.ld.com (SYN# 0305 19960220\99-0001.SOL)