Crane Division, Naval Surface Warfare Center, Crane, IN 47522-5011, Code 1164

66 -- SCANNING ELECTRON MICROSCOPE (SEM) MEASUREMENT SYSTEM SOL N00164-96-R-0053 DUE 040896 POC Contact, Ms Terry Davis, Code 1164EJ, 812-854-3704/telefax 812-854-3465, Douglas McDaniel, Contracting Officer The Navy requires one scanning electron microscope measurement system comprising a scanning electron microscope and x-ray system. Purchase description is Brand Name or Equal Amray Model 3200/S SEM and Noran Model M3050 Energy Dispersive X-Ray System. Offers of equal products are encouraged. Required salient characteristics for the low pressure SEM (4 Torr) include 4 nm (high vacuum mode) and 6 nm (low vacuum mode) resolution, 45 degree conical final lens, 5X to 400,000X digital magnification, and 0 to 30 kV digital accelerating voltage. The x-ray system salient characteristics include less than 2 eV shift versus count rate at maximum pulse processor input, full computer control, and bias supply with automatic LN2 level protection circuitry. FAR Part 12 will be utilized. The system is to be shipped FOB destination to NSWC, Crane, IN, within 60 days after contract award. Inspection and acceptance will be at destination following installation by the contractor. Four option years of maintenance are required after expiration of the commercial warranty. All responsible sources may submit an offer which will be considered. (0058)

Loren Data Corp. http://www.ld.com (SYN# 0357 19960228\66-0004.SOL)