Naval Research Laboratory, 4555 Overlook Ave, S.W., Washington DC 20375-5326

66 -- SCANNING PROBE MICROSCOPE (SPM) SOL N00014-96-R-DL01 POC Dian Lockamy, Contract Specialist, Code 3220.DL, Contracting Officer, Wayne A. Carrington, (202) 767-2550. The Naval Research Laboratory synopsis published on April 3, 1996 for Scanning Probe Microscope (SPM) is modified to substitute the following: The Naval Research Laboratory has a requirement for one (1) Scanning Probe Microscope (SPM) for use in surface characterization and magnetic domain imaging of thin film samples. The SPM must be able to satisfactorily de-convolute magnetic topography from surface topography. This system should include all the hardware and software to carry out scanning tunneling microscopy as well as contact, intermittent contact and non-contact mode force microscopy. Along with atomic force microscopy, the microscope will be used for investigation of lateral forces, electric forces and, most critically, magnetic forces, particularly associated with magnetic domain wall imaging. The system must be able to accommodate wafer samples at least 4 inches in diameter utilizing a non magnetic sample holder. For diverse use of the system, a variety of scanning probes will be required, the most important being single-crystal Si cantilevers of relatively large spring constant (1- 10N/m) which work best for intermittent contact mode and non-contact mode magnetic force microscopy. These are coated with a magnetic thin film that should essentially be tailored to the magnetic system to be studied. Optional items include one (1) vibration/isolation table, one (1) high quality color ink-jet (or equivalent) for routine output of images, on-site installation, and start-up training. Requests for copies must be submitted in writing to the Naval Research Laboratory; Attn: Code 3220.DL; 4555 Overlook Avenue, S.W.; Washington, DC 20375-5326, FAX (202) 767-5896 or 6197. NRL Ref. No. DL01. RFP Closing Date 30 days after issuance. (0108)

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