NASA Lewis Research Center, 21000 Brookpark Road, Cleveland, Ohio 44135

66 -- SCANNING ELECTRON MICROSCOPE SYSTEM - PART 2 SOL SFO3-051357 POC Glen M. Williams, Contracting Officer, who may be contacted at (216) 433-2885, Mail Stop 500-306 I This is a combined synopsis/SFO for commercial items prepared in accordance with FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; offers are being requested and a written solicitation will not be issued. This SFO and incorporated provisions and clauses are those in effect through Federal Acquisition Circular 90-37. The Standard Industrial Classification (SIC) Code for this acquisition is 3826. The Small Business Size Standard is 500 employees. Under the Defense Priorities and Allocations System (DPAS)(CFR 15 Part 350), the rating assigned to this acquisition is DO-C9. This procurement is being conducted under the NASA Midrange Pilot Test Program approved by the Office of Federal Procurement Policy on April 16, 1993. THE CONTINUATION OF THE SPECIFICATIONS FOR THE SCANNING ELECTRON MICROSCOPE SYSTEM FROM THE SYNOPSIS PART 1 ARE AS FOLLOWS: Item 1F. Imaging System 1. The imaging system shall provide a magnification range from 25x to 1,100,000x at 200KV. Radial distortion shall be less than one percent and spiral distortion shall be less than 1.5 percent over a 100 mm diameter on the plate. 2. Automatic lens normalizing shall be provided to give a reproducibility of magnification of less than 1.5 percent. 3. Automatic correction for electron energy losses up to 1/1000th of the primary beam energy caused by chromatic errors in thick samples shall be corrected up to 100 mm diameter on the plate. 4. Microprocessor shall allow free lens control of any or all lenses starting from the last used settings. Storage and recall of a minimum of six configurations shall be possible. External computer control of lens configurations shall also be provided. 5. Main viewing screen shall be separate from the focusing screen. A binocular microscope shall be provided for observing the image on the focusing screen at a minimum of 12X magnification. Binoculars shall have high point eye pieces for operators wearing glasses. 6. Microprocessor shall provide a facility to accurately measure distances, heights, ratios, and angles of all TEM images and diffraction patterns. 7. Software shall be provided to allow an Apple Macintosh computer to allow storage and recall of lens settings. Item 1G. Diffraction 1. Selected area aperture holder in the diffraction lens shall accept a minimum of four standard 3 mm apertures which can be selected by a click-stop mechanism. 2. Dark field imaging shall be performed by tilting the beam using either X-Y or conical controls. Tilt parameters shall be displayed by the microprocessor . 3. Microprocessor control shall provide a calibrated shift capability to determine lattice spacings and crystal structures directly in the microscope. 4. STEM shall be able to form convergent beam diffraction patterns of areas down to 2 nm diameter with the specimen in the eucentric position. Convergence angle shall be continuously variable to make the diffraction discs as large as possible without overlapping. Item 1H. Film Camera 1. STEM shall include a film camera capable of recording a minimum of fifty-five (55) 3 1/4'' x 4'' electron imaging films. 2. Camera control shall include both automatic and manual exposure settings. Automatic exposure shall be controlled by the electron intensity on the main screen or the electron intensity on the focusing screen. 3. Microprocessor shall provide fully automatic through-focus series of exposures by selection of number of exposures and the focus increment. 4. Notation on the negative shall include as a minimum; magnification, user code exposure number, date, and at least 60 free text characters. 5. Film camera shall in no way interfere with installation of the imaging filter (Item 2). 6. The contractor shall provide a minimum of three (3) sets of film carriers, three (3) film supply boxes, and three (3) exposed film boxes. Item 1I. Scanning System 1. Scanning optics shall produce a stationary diffraction pattern in the objective lens back focal plane under all conditions. 2. Shall be able to perform spot sizes less that 2 nm at the eucentric position. 3. Detectors shall be provided for bright field, dark field, and back scattered electron imaging. Detectors shall not alter in any way the specification of the basic instrument. Back scattered electron detector shall not limit specimen tilt range. 4. Continuous scan rotation shall be provided. 5. Dual monitors for viewing images via different detectors simultaneously shall be included. 6. A high resolution monitor shall be used for photography using a Polaroid 4x5 camera. 7. Microprocessor control shall provide accurate measurement of distances, heights, ratios, and angles for all scanned images. 8. Selected area channeling patterns shall be possible to be displayed or recorded while viewing the area of the specimen from which it is obtained on the TEM screen. Beam rocking up to twenty degrees shall be required for producing channeling patterns. 9. Scanning system shall allow descanning of the scanning beam so that each image point is transferred back onto the optical axis and into the entrance slit of the imaging filter. Item 1J. X-ray Energy Dispersive Spectroscopy Provisions 1. Design of the STEM shall provide for an x-ray collection geometry with a minimum eighteen (18) degree take off angle and 0.15 steradians solid angle on a thirty (30) millimeter square detector crystal. 2. Microprocessor shall provide for an x-ray detector protection function. 3. Scanning system shall allow beam control by the x-ray energy dispersive system. Item 1K. Miscellaneous 1. Contractor shall provide a mains matching transformer capable of inputs from 190 to 440 volts and output of 220 volts. Transformer shall include proper isolation and filtering to prevent interference from accessories. 2. Contractor shall supply an air compressor to meet the STEM's requirements. 3. Contractor shall provide a radiation alarm monitoring system and sulfur hexafluoride detector. 4. Contractor shall provide a water cooled water chiller, film dessicator with mechanical vacuum pump, and nitrogen gas regulator. Item 2. The contractor shall provide an Electron Imaging Filter which shall have the following features and capabilities; Item 2A. Design 1. The Electron Imaging Filter shall be compatible with Item 1 and shall be capable of operating up to and including 200 KV. 2. The Electron Imaging Filter shall be of a post column design. 3. The Electron Imaging Filter shall be able to form energy-filtered images when the STEM is operated in image mode, energy-filtered diffraction patterns when the STEM is operated in diffraction mode, and collection of parallel electron energy-loss spectra. 4. The Electron Imaging Filter shall correct for second-order aberrations in the energy loss spectrum. 5. The Electron Imaging Filter shall include an energy selecting slit with an opening of at least 50 eV. The slit's opening and retraction shall be pneumatically and computer controlled. 6. The Electron Imaging Filter shall include a minimum of three (3) entrance apertures. Selection of aperture shall be pneumatically actuated under computer control. Apertures shall be pre-centered and require no manual adjustment. 7. The Electron Imaging Filter shall consist of a minimum of four quadrupole and five sextupole lenses to provide rotation free operation when switching between energy dispersions. The range of energy dispersions shall be equal to or better than 0.05 eV per channel to 1.0 eV per channel. 8. The Electron Imaging Filter's detection chamber shall include both a TV rate camera and a Grade A 1024 by 1024 pixel slow scan CCD. The TV rate camera shall include a digital averaging device to improve the signal to noise during live viewing. The slow scan CCD shall have a minimum dynamic range of 16000:1. Item 2B. Computer and Applications Software 1. The Electron Imaging Filter System shall be include an Apple Power Macintosh computer with a minimum of a 100 mHz processor, 48 Mb of memory, 1.4 Mb floppy drive, 1.2 Gb hard drive, removable 1.0 Gb drive, CD-ROM drive, network capability, keyboard, track ball, and twenty-one (21) inch color monitor. 2. Application software shall be included for image acquisition and analysis. 3. Application software shall be included for energy loss spectrum acquisition and quantification. Elemental mapping of 512 x 512 pixels shall be included. Software for standard-less quantification using built in cross-sections for all elements shall be included. 4. Electron Imaging Filter System shall be able to read a minimum of five elctron energy loss spectra per second. (0165)

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