National Institutes of Health, 6120 Executive Blvd., Room 868, Bethesda, MD 20892-7

66 -- TRANSMISSION ELECTRON MICROSCOPE UPGRADE SOL 263-96-P(BC)-0131 POC Sheri Lawson, Contracting Officer, 301/402-3065 or Edward Wilgus, Chief, Acquisitions Branch A/B, 301/402-3070. Under authority of 41 U.S.C. 253(c)(1), FAR 6.302-1, the Government intends to procure from LEO Electron Microscopy, Inc., One Zeiss Drive, Thornwood, NY 10594, for the upgrade of an existing Jeol 100 CX transmission electron microscope (TEM). The Contractor shall furnish,deliver, and install all hardware and software required for the upgrade. After installation and successful demonstration that the equipment meets and/or exceeds the resolution specifications, the Contractor shall provide on-site system training. The training shall be provided at no additional cost to the Government. The upgrade to an ''Energy-Filtering Transmission Electron Microscope'' (EFTEM), shall provide the following increase in capability involving rapidly frozen neuronal specimens: 1) Improved contrast of unstained conventional and cryogenic specimens by imaging in zero-loss mode. 2) Improved imaging of thick specimens by removal of chromatic aberration in zero-loss mode. 3) Element-specific or -selective imaging and electron energy less spectroscopy (EELS) by operation of the filter in the energy-loss mode. 4) Improved specimen stability and reduced specimen damage following from the lower electron doses required when contrast is better. 5) Specialized and customized imaging, e.g., of metal replicas or hydrated specimens, by imaging in the low-loss region of the energy loss spectrum. Additionally, the upgrade shall have the following features: a) an in-column energy filter of the ''omega'' design, b) improved contrast while limiting specimen exposure by virtue of the parallel (Kohler) illumination and automatic condenser aperture selection (AIS) systems, c) ability to acquire filtered images at low magnification ((1000X), which is essential for biological specimens, d) ability to obtain and maintain, through the incorporation of a dry nitrogen-ventilated airlock and a unique design of specimen anti-contaminator, contamination-free specimens at temperatures (-170O C for better than four (4) hours, and, e) ability to acquire, through the use of an available virtually single-electron sensitive slow-scan CCD camera and in combination with the energy filter and anti-contaminator, extremely low-dose images ((100 e/nm2) of undamaged beam-sensitive specimens at close to true focus. The intended procurement will be classified under SIC 3826, Analytical Instruments, with a size standard of 500 employees. It is the Government's belief that these requirements can only be met by LEO Electron Microscopy, Inc. This is not a formal solicitation. However, concerns that respond to this notice must furnish concise responses directed specifically to the requirements mentioned above. Sources demonstrating the capability to accomplish the above, shall supply pertinent information in sufficient detail to demonstrate their ability to perform. Information furnished shall include enough material to perform a proper evaluation. Closing date will be 45 calendar days after publication of this notice. Note 22. (0165)

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