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COMMERCE BUSINESS DAILY ISSUE OF JUNE 17,1996 PSA#1617Room 6875, JEH-FBI Bldg., 10th & Pennsylvania Ave., NW, Washington DC
20535 96 -- SCANNING ELECTRON MICROSCOPE, ENERGY DISPERSIVE X-RAY ABALYZER,
WAVELENGTH DISPERSIVE X-RAY ANALYZER SOL RFP-6956 POC Darlene W.
Robinson, Contract specialist, 703-814-4917. The Federal Bureau of
Investigaton (FBI) is soliciting proposals for commercial items; three
(3) analying systems, brand name or equal, multi-award. FOB
Destination within the premises located in Washington, DC.
Manufacturer's standard commercial warranty. These systems are; (a)
JEOL USA Inc. - JSM-6300 Scanning Electron Microscope (SEM) (b) Oxford
Instrument Inc. - L300QI Energy Dispersive X-Ray Analyzer (EDXA) (c)
Microspec Corp. - WDX-400 Wavelength Dispersive X-Ray Analyzer (WDXA).
All three (3) systems must be compatible and fully integrated.
Interested parties should submit written request for (RFP-6956) which
must contain the ''term and conditions'' for the products within 15
days of this synopsis. NO TELEPHONE REQUEST WILL BE HONORED. (0165) Loren Data Corp. http://www.ld.com (SYN# 0374 19960614\96-0003.SOL)
96 - Ores, Minerals and Their Primary Products Index Page
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