National Institute of Standards and Technology, Acquisition and Assistance Division, Bldg. 301, Room B117, Gaithersburg, MD 20899

66 -- ATOMIC FORCE MICROSCOPE CONTROLLER SOL 52SBNB6C9224 DUE 080596 POC Kathleen Lettofsky (301) 975-6342 The National Institute of Standards and Technology (NIST) intends to acquire an atomic force microscope (AFM) controller, with options to purchase various scanning probe capabilities within 180 days after contract award date. The controller shall have all parts and computer equipment necessary to perform: 1) contact mode AFM in air or liquid; 2) non-contact mode AFM, including intermittent contact, in air or liquid; 3) phase-imaging in intermittent contact mode; 4) scanning tunnelling microscopy; 5) lateral force microscopy and 6) some near-field scanning optical microscope control functions. Options that may be purchased within 180 days shall include the hardware (e.g., scanners, probe heads, and isolation equipment) and additional software necessary to perform each of these functions, as well as installation and training on the equipment. The contractor shall also provide warranty for the instrument for a period of one year. For the life of the instrument, all software upgrades shall be supplied. Delivery required Freight on Board (FOB) destination, Gaithersburg, MD within 60 days after contract award. All responsible sources may submit a proposal which shall be considered. Only written requests for copies of the solicitation shall be honored. Requests for copies of the solicitation may be telefaxed to (301) 963-7732. (0172)

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