National Institute of Standards and Technology, Acquisition and Assistance Division, Building 301, Room B117, Gaithersburg, MD 20899

66 -- NANOSCOPE CONTROL SYSTEM SOL 53SBNB6C9195 DUE 072996 POC Linda Shariati (301) 975-5053 This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; quotes are being requested and a written solicitation will not be issued. The solicitation number is 53SBNB6C9195 and the solicitation is issued as a request for quotation (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular 90-33. The standard industrial classification (SIC) code is 3826 and the small business size standard is 500 employees. The contract line item numbers (CLIN), items, quantities and units of measure are: CLIN 0001 Replacement (upgrade) controlling Electronics and Software Package for Nanoscope II Scanning Tunneling Microscope including standard warranty and manuals, 1 lot; CLIN 0002 Signal Breakout Box, 1 each. Please submit your pricing in accordance with the CLIN structure identified in the sentence above. The National Institute of Standards and Technology (NIST) is interested in acquiring a Nanoscope E Scanning Probe Microscope Control System with feedback and control electronics compatible with either STM or AFM Microscope Assemblies. The system shall provide setting tip bias voltage with 16 bits of resolution over a range of 10V; a choice of maximum X-Y scan drive voltages of plus or minus 220 V with 16 bits of resolution in the scan pattern, 16 bits of resolution in the scan size, and 16 bits of resolution in the scan offset; scan drive voltage in Z of plus or minus 220V with 16 bits of resolution in the setting of these voltages; feedback for control of the tip-sample separation shall be digital for sufficient flexibility and accuracy of control. Sampling with 14 bits of resolution and a sample rate of 70kHz or greater in control loop is required. The feedback and scan drive functions shall have adequate performance for: 122 Hz line rate for a 256x256 point scan, 244 Hz for a 128x128 point scan 60 Hz for a 512x512 point scan, for small scans; A lateral scan rate of 500 microns per second with the largest optional scanner; atomic resolution on graphite with a large range (greater than 75 micron) STM or AFM scanner. The system shall allow a choice of logarithmic or linear feedback response, and provide a choice of input filters and gain types, such as integral, proportional, or digitally expressed functions which include the ability to perform realtime scan linearization, scanline rounding, to rapidly increase gain at a step or to utilize information from the preceding scan to allow the tip to anticipate features in the current scan. The instrument shall measure the derivative of: tip current with respect to tip voltage and tip current with respect to the vertical position of the tip. It shall also measure curves of tip current as a function of tip voltage, bias voltage or tip/sample separation with the tip positioned at a point on the surface or in current versus voltage image mode over the scan area (Current Image Tunneling Spectroscopy). The system shall provide a non Windows, extended DOS Interface that provides true multitasking and 32 bit performance for faster realtime response. The user shall select microscope and scanner. The user shall be able to set the following scan and probing parameters, both before and during scanning: scan rate; feedback gain - integral, proportional, and 2D; feedback parameter setpoint; scan size; scan offset; samples per scan line -128, 256 or 512; bias voltage or cantilever deflection; input filter; input mode - log or linear; operating mode - constant height or constant feedback parameter; and scan rotation for center mount scanners. The system shall display the data in top view mode as scanning is taking place (Realtime Mode). The user shall have the option to display the sampled data from a single scan line in oscilloscope format. In either single trace or trace/retrace. The user shall have the option to store the data from a scan for analysis at any time. The user shall also have the option to display as a function of X-Y position either error signal, height or second input channel. Other realtime options are: Simultaneous image display. Two images or scope traces may be displayed as acquired. These images may be topography and lateral force data, forward and reverse scan direction topography, and other combinations. System shall support facility to initiate data capture and go into offline analysis mode without interrupting capture. System shall provide the capability to capture at least 33 MBytes of data before archiving is required. The user shall have the following data analysis and display capabilities: (1) User shall have the option of displaying the information acquired in the form of X-Y position plots, tip position, tunneling current, and derivatives as colored topview, cross-sectional line-plot, bearing ratio or shaded 3-D surfaces. Facilities for producing high quality color images of such plots on paper are required. Output shall be compatible with commercially available laser printers; (2) Graphics shall be implemented with an image resolution of 1024x768 pixels with least 256 colors from a palette of at least 16 million or 256 shades of grey per color. The data shall be recorded in a form that can be communicated to other image processors in a straightforward way; (3) User shall have the option of filtering the image data with high-pass, low-pass, median, single line replacement, geometric, and two dimensional Fourier Transform filters. These filters shall be graphically controlled and displayed to facilitate usage; (4) Surface analysis functions shall include but not be limited to: surface roughness over selectable regions of an image, including mean, RMS, and fractal, with thresholding to define range included in roughness calculation and artifact removal such as flattening, plane fit and line and region removal. A facility shall be provided for archival storage of acquired images, line plots and reduced data, together with all relevant parameters leading to their production. The controller serving archival storage, display and control functions shall be of the Pentium compatible type with a minimum of: Intel Pentium PCI 100Mhz, 16Mb RAM, 1.2 Gb HD, 3.5 inch FD, and two color monitors. Computer is modified to contain custom processor and graphics capability. The system shall include two high resolution color monitors for control and display. The system shall be capable of computing a 512x512 surface plot in 3 seconds or less, and a two dimensional 512x512 Fourier Transform in 8 seconds or less. The Contractor shall provide one set of the most current version of user manuals and publications for all items provided under this contract. The Contractor shall include the same warranty terms offered to the general public in customary commercial practices. NIST requires delivery of the system within 45 calendar days after receipt of the contract. FOB Destination. The place of delivery is: NIST, Shipping and Receiving, Bldg 301, Gaithersburg, Maryland 20899. The provision at FAR 52.212-1,Instructions to Offerors - Commercial, applies to this acquisition. The provision at FAR 52.212-2, Evaluation - Commercial Items applies with the following specific evaluation criteria to be included in paragraph (a): (i) price, (ii) technical capability of the item offered to meet the Government requirement; and, (iii) past performance/experience. Technical and past performance, when combined, are significantly more important than cost or price. Evaluation of the specific evaluation criteria will be based on information submitted in response to this RFQ. It is recommended that information be included which demonstrates that the items offered meet all the requirements identified in this combined synopsis/solicitation. In addition, past performance/experience will be evaluated on information which demonstrates five years experience with STM control electronics and demonstrates that at least 10 units of STM Control Electronics were sold in the past five years (include contact points, telephone numbers, and a description of the items). Information which merely offers to furnish an item in accordance with the requirements of the Government or does not address a requirement contained herein will be evaluated based on this information or lack of information. Offerors are cautioned to submit quotes on the most favorable basis, since the Government may elect to make an award without further discussions or negotiations. Offerors shall include a completed copy of the provision at 52.212-3, Offeror Representations and Certifications-Commercial Items, with its offer. The clause at 52.212-4, Contract Terms and Conditions - Commercial Items, applies to this acquisition. The clause at 52.212-5, Contract Terms and Conditions Required to Implement Statutes or Executive Orders - Commercial Items, applies to this acquisition and includes the following FAR clauses:FAR 52.222-26, Equal Opportunity; FAR 52.222-35, Affirmative Action for Special Disabled and Vietnam Era Veterans; FAR 52.222-36, Affirmative Action for Handicapped Workers; FAR 52.222-37, Employment Reports on Special Disabled Veterans and Veterans of the Vietnam Era; FAR 52.225-3, Buy American Act - Supplies; FAR 52.225-18, European Community Sanctions for End Products; and, FAR 52.225-21, Buy American Act -NAFTA Implementation Act-Balance of Payments Program. Interested parties shall submit a quote and information pertaining to this requirement, which includes but should not be limited to, the 11 items outlined in FAR 52.212-1(b) and information which responds to the requirements set forth in this announcment, to the National Institute of Standards and Technology, Acquisition and Assistance Division, Building 301, Room B117, Gaithersburg, Maryland 20899, ATTN: Linda Shariati, Solicitation Number 53SBNB6C9195. Quotes and information pertaining to this requirement must be received by 3:00 pm Eastern Time on July 29,1996. Responses received at the address specified for the receipt of quotes and information after the exact time specified for receipt of offers will not be considered. For information regarding this solicitation contact Linda Shariati, Contract Specialist. Her telephone number is (301)975-5053. See Numbered Note 1. (0191)

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