National Institute of Standards and Technology, Acquisition and Assistance Division, Building 301, Room B117, Gaithersburg, MD

66 -- UPGRADE NANOSCOPE II TO NANOSCOPE IIIA, SCANNER AND AFM HEAD SOL 52SBNB6C9229 DUE 090996 POC Keith Kennedy (301) 975-6325/Contracting Officer, Lisa K. Jandovitz (301) 975-6344 The National Institute of Standards and Technology (NIST) intends to buy from Digital Instruments, Santa Barbara, CA, on a sole source basis in accordance with FAR 6.302-1, a nanoscope II upgrade to nanoscope IIIa, 125 um x 125 um scanner and multimode atomic force (AFM) microscope head. Salient specifications of the nanoscope IIIa include: scanner control in X and Y from sub nm scale to 125 micrometers; autotune feature to automate cantilever tuning and set point selection; 16-bit resolution on all three axes of motion; capability to zoom, rotate, and offset the scan anywhere within the maximum scan range; fully-compatible with nanoscope stand alone AFM; digital signal processor (DSP): CRT display of surface maps and parameters; windowed menus and graphic displays for control of real-time and off-line features, adjustable scan rate, size and offset; selectable AFM feedback including TappingMode and other oscillating tip modes. The salient characteristics of the scanner and head include: capability for performing contacting mode and tapping mode AFM, scanning tunneling microscopy, lateral force microscopy, and force modulation; lateral resolution as small as 0.3 nm, lateral range up to 125 um x 125 um, vertical resolution as small as 0.05 nm; vertical range up to 8 um; optical microscope with video output for viewing of the sample surface during scanning; fully compatible with all functions of nanoscope IIIa controller. No solicitation is available. This notice of intent is not a request for competitive proposals. See numbered Note 22. (0201)

Loren Data Corp. http://www.ld.com (SYN# 0454 19960722\66-0004.SOL)