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COMMERCE BUSINESS DAILY ISSUE OF JULY 29,1996 PSA#1646Department of Commerce, Mountain Administrative Support Center,
Procurement Division, MC3, 325 Broadway, Boulder, CO 80303-3328 36 -- MICROELECTROMECHANICAL SYSTEMS MEMS) PROCESSING FURNACE BANK SOL
52RANB60C043 POC Procurement Technicians, 303-497-3221 This is a
combined synopsis/solicitation for commercial items prepared in
accordance with the format in FAR Subpart 12.6, as supplemented with
additional information included in this notice. This announcement
constitutes the only solicitation; proposals are hereby requested and
a written solicitation will not be issued. The solicitation number is
52RANB60C043 and is issued as a Request for Proposal (RFP). The
National Institute of Standards and Technology (NIST) requires a
furnace bank (Item 0001 - 1 each) for bulk and surface micromachining
on Si wafers up to 100 mm in diameter for research and development of
integrated ultra sensitive force transducers. Minimum capabilities
include the following processes: 1) Dry/Wet oxidation of Si wafers with
silicon dioxide thickness up to 1 micrometer. The dry oxidation process
should yield pinhole free oxide films for 2 micrometer line width MOS
gate technology. The wet oxidation process should be capable of rapid
growth of oxide films for masking dopant diffusion patterns. 2) Solid
source boron doping. The boron doping process with BN source wafers
should yield dopant profiles suitable for bulk micromachining of Si
with subsequent anisotropic wet chemical etches. In addition, doping
profiles suitable for 2 micrometer line width gate technology should be
attainable with the process. 3) Low-stress silicon nitride low pressure
chemical vapor deposition (LPCVD). The LPCVD silicon nitride process
should be capable of depositing pinhole free film to be used for
masking dopant diffusion patterns. In addition, the process should be
capable of depositing low stress silicon nitride onto sacrificial oxide
or glass layers for the purposes of surface micromachining free
standing silicon nitride micromechanical devices for MEMS integration.
4) Poly Si LPCVD. The process should be capable of depositing poly Si
onto sacrificial oxide or glass layers for the purposes of surface
micromachining free poly Si micromechanical devices for MEMS
integration. NIST is also expecting to expand the capabilities of the
furnace bank at some time in the future to include a fifth process
(Item 2 - optional item): 5) Phosphorous doped low temperature oxide
(LTO) LPCVD. The LTO LPCVD process should be capable of depositing
smooth sacrificial foundation layers for silicon nitride or poly Si
films. The LTO layer should have a fast wet chemical etch rate compared
to the Si, SiN, or poly Si films. Offerors are encouraged to break out
proposals for each process including the optional item for the LTO
LPCVD process in the event that funds are available. Configurations
combining two or more processes in a single tube will be considered.
Refurbished equipment will be considered. Small footprints for the boat
loading station, furnace bank, and pumping stations are desirable. An
ability to demonstrate processes capabilities by providing
documentation of working instruments in the field fulfilling similar
requirements is desirable. Specifications: The specifications begin
with four categories dealing generally with the tube furnace
configuration and an additional five categories dealing with each
specific process. Preferred specifications are preferred but not
required and are indicated accordingly as ''preferred'' in the text.
Preferred items may be offered as options. Laminar Flow Boat Loader
Station: (a) a frame for vertically stacked boat loaders mated to tube
furnaces; (b) cantilevered paddle mounts (automatic operation via
master process sequence preferred); (c) class 100 HEPA filters; and (d)
scavenger covers. Integrated Gas Scavenger System. Tube Furnaces: (a)
water cooled heat exchanger; (b) three zone heaters on LPCVD processes;
(c) spike thermocouples for each furnace-three zone control for LPCVD
processes; (d) PID temperature control for each thermocouple via
temperature controllers governed by master process sequencer; and (e)
heating elements controlled by SCRs in PID temperature controller
feedback loop. Master Process Sequencer: (a) independent temperature
control and ramping for each process tube; (b) independent gas flow
control for each gas drop; (c) multiple step process sequencing (100
steps preferred); (d) recipe storage capacity (at least 15 recipe
capacity preferred); (e) boat in-out commands (preferred); and (f)
pressure control for LPCVD processes. Oxidation Processes: (a) maximum
process temperature 1200 C; (b) Hydrogen/oxygen torch assembly for wet
oxide growth (external torch preferred); (c) gas drops for hydrogen,
oxygen, and nitrogen; (d) trichloroethane (TCA) source (preferred); (e)
mass flow controllers for gas drops governed by master process
controller; (f) quartz reaction tube (preferred); (g) quartz wafer boat
(preferred); (h) paddle assembly for quartz boats; and (i) isolation
tube collars and flanges for atmospheric processing. Solid Source Boron
Doping Process: (a) maximum process temperature 1200 C; (b) Gas drops
for nitrogen and oxygen; (c) mass flow controllers for gas drops
governed by master process sequencer; (d) quartz reaction tube
(preferred); (e) quartz wafer boat (preferred); (f) paddle assembly for
quartz boat; and (g) isolation tube collars and flanges for atmospheric
processing. Low Stress Silicon Nitride Process: (a) maximum process
temperature as required; (b) gas drops for nitrogen, silane, and
ammonia; (c) dicholorosilane (DCS) source (preferred); (d) mass flow
controllers for gas drops governed by master process sequencer; (e)
LPCVD quartz reaction tube; (f) quartz wafer boat (preferred); (g)
paddle assembly for quartz boats; (h) isolation tube collars and
flanges for LPCVD processing; and (i) vacuum pumping station and
pressure controller governed by master process sequencer (stackable
pump configuration preferred). Poly Si Process (this process may be
combined with the Low Stress Silicon Nitride Process into one reaction
tube): (a) maximum process temperature as required; (b) gas drops for
nitrogen and silane; (c) mass flow controllers for gas drops governed
by master process sequencer; (d) LPCVD quartz reaction tube; (e)
quartz wafer boat (preferred); (f) paddle assembly for quartz boats;
(f) isolation tube collars and flanges for LPCVD processing; and vacuum
pumping station and pressure controller governed by master process
sequencer (stackable pump configuration preferred). LTO Process
(optional): (a) maximum process temperature as required; (b) gas drops
for nitrogen, silane, and phosphine; (c) mass flow controllers for gas
drops governed by master process sequencer; (d) LPCVD quartz reaction
tube; (e) quartz wafer boat (preferred); (f) paddle assembly for quartz
boats; (g) isolation tube collars and flanges for LPCVD processing; and
vacuum pumping station and pressure controller governed by master
process sequencer (stackable pump configuration preferred). This
solicitation and incorporated provisions and clauses are those in
effect through Federal Acquisition Circular 90-38. This acquisition is
unrestricted. Standard Industrial Classification code is 3559. Small
business size standard is 500 employees. Delivery shall be 150 calendar
days after Contractor's receipt of a notice of award. Delivery shall be
F.O.B. Destination to NIST, 325 Broadway, Boulder, Colorado 80303-3328.
Forms and clauses stipulated herein may be downloaded via the
Internet's World Wide Web at the following address:
http://www.masc.noaa.gov/masc/masc_prc.html#contract. Interested
parties are responsible for accessing and downloading documents from
that (or any other) site. The following provisions and clauses apply to
this solicitation: FAR 52.212-1, (provision) ''Instructions to Offerors
- Commercial Items''; FAR 52.212-2, (provision) ''Evaluation -
Commercial Items''; FAR 52.213-3, (provision) ''Offeror Representations
and Certifications - Commercial Items'' (NOTE: Offerors shall include
with their offers a completed copy of the provision at FAR 52.213-3.);
FAR 52.212-4, (clause) ''Contract Terms and Conditions - Commercial
Items''; FAR 52.212-5, (clause) ''Contract Terms and Conditions
Required to Implement Statutes or Execuive Orders, Commercial Items''
including the following additional FAR clauses in paragraph (b):
52.203-6, 52.203-10, 52.219-8, 52.219-14, 52.222- 26, 52.222-35,
52.222-36, 52.222-37, 52.225.3, 52.225-9, 52.225- 19 and 52.225-21. The
evaluation criteria shall be: (a) Meets or exceeds technical criteria
as outlined in the specifications - 100 points; (b) Past performance -
60 points; (c) Demonstration of film deposition uniformity and quality
- 24 points; (d) Installation, facilitation and safety plan - 10
points; (e) Warranty, service, and training plans - 10 points (204
points total). Award of the contract will be made, within the limit of
available funding, to that offeror whose proposal contains the
combination of those factors offering the best overall value to the
Government. This will be determined by comparing the differences in the
values of technical and management features with differences in cost to
the Government. In making this comparison the Government is more
concerned with striking the most advantageous balance between technical
and management features and cost to the Government. Offers are due at
3:00 p.m. on August 12, 1996 and shall be mailed to BID DEPOSITORY,
DOC, MASC, MC3, Procurement Division, Room 5532, 325 Broadway, Boulder,
CO 80303-3328. (0207) Loren Data Corp. http://www.ld.com (SYN# 0318 19960726\36-0001.SOL)
36 - Special Industry Machinery Index Page
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