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COMMERCE BUSINESS DAILY ISSUE OF AUGUST 29,1996 PSA#1669National Institute of Standards and Technology, Acquisition and
Assistance Division, Building 301, Room B117, Gaithersburg, MD 20899 66 -- BUILD AN INFRA-RED INTERFEROMETER FOR WINDOW THICKNESS SOL
52SBNB6C9246 DUE 091396 POC Linda Shariati (301) 975-5053 The National
Institute of Standards and Technology (NIST) intends to build an
infra-red interferometer for window thickness. The Precision Machining
Research Facility at NIST has built a bench-top demonstration
interferometer and developed associated measurement protocols which
allows for measurement of thickness, thickness variation, and bow of
windows. Using anappropriate laser, these measurements can be made on
materials of interest to the optics, IC and other industries and, at
appropriate wavelengths, does not require that both surfaces be
polished. The Contractor shall build a phase shifting prototype
instrument capable of measuring windows (wafers) up to 300 mm diameter.
The Contractor shall provide key personnel for this acquisition. This
acquisition is being conducted in three phases. This Commerce Business
Daily announcement constitutes Phase I. Phase I is a request for all
interested parties to submit information which identifies their
qualification to meet this requirement. Candidates will be determined
to be qualified based on the following two factors. These factors are
of equal weight. FACTOR 1. Experience - Evaluation of this factor will
be based on information submitted by a candidate and feedback from
clients which demonstrates applicable, constructive, and affirmative
experience in developing and installing at least three instruments, in
the field, either: (1) phase measuring interferometers for the
measurement of surface figure or transmitted wavefront accuracy of
optical components;or, (2) instruments for the measurement of window or
wafer thickness variation using non-interferometric methods. Candidates
shall either (a) provide a list of at least three clients, the name and
telephone number of the client point of contact, the type of
instruments which was developed and installed and the date of
installation; or (b) where the Key Personnel (see Factor 2 below) in a
candidate's organization obtained the necessary experience working for
a different organization, the candidate organization shall provide
name(s) and telephone number(s) of references which reflect the
experience. FACTOR 2 - Qualification of Proposed Key Personnel
-Evaluation of this factor will be based on resumes submitted by the
candidate which demonstrates the qualifications of the proposed key
personnel who will be working on the subsequent contract. The resume
must show that the key personnel has knowledge of the optical (for
example, design, stray light, speckle, etc.), control (for example
phase stepping, data acquisition), and software (for example phase
unwrapping, zernike representations, etc) issues involved in the
development of the required interferometer for window thickness.
Interested candidates shall provide information which demonstrates
their qualification and addresses the factors listed above to the
National Institute of Standards and Technology, Acquisition and
Assistance Division, Building 301, Room B117, Gaithersburg, Maryland
20899 by 3:00 pm local time on September 13, 1996. Submissions will be
evaluated. Qualified candidates will be notified and requested to
participate in Phase 2 of this acquisition. Phase 2 will be the
distribution of a non-disclosure agreement to all qualified candidates.
The qualified candidates will be asked to sign a non-disclosure
agreement. Candidates who do not sign a non-disclosure agreement will
not be considered for contract award. Phase 3 will be the issuance of
a Request for Proposal (RFP). The RFP will only be issued to candidates
who were determined to be qualified as specified herein and who have
signed and returned a non-disclosure agreement within a due date which
will be specified when the agreement is distributed. All responsible
sources may submit information identifying their qualification which
will be considered by the agency. See Numbered Note 26. (0240) Loren Data Corp. http://www.ld.com (SYN# 0242 19960828\66-0003.SOL)
66 - Instruments and Laboratory Equipment Index Page
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