DEVELOPMENTS AT NIST POC: Ernie Graf. Researchers in the Precision Engineering Division at the National Institute of Standards and Technology (NIST) have developed a new technology, Stepped Microcone Optical Alignment Device, NIST Docket Number 96-055. The technology comprises a 3-dimensional structure that permits a complete through-focus microscope measurement without actually refocusing, and allows comparison of this measurement with analogous results obtained by the more conventional method of mechanically refocusing the microscope. The comparison allows the user to measure (and thus compensate for) the component of Tool Induced Shift (TIS) created during mechanical refocusing. Any parties interested in the further development or licensing of the technology described above may write to: Ernie Graf, National Institute of Standards and Technology, Building 820, Room 213, Gaithersburg, MD 20899. This is not an announcement of a contract or grant. Researchers in the Precision Engineering Division at the National Institute of Standards and Technology (NIST) have developed a new technology, Kinematic Focus Mechanism, NIST Docket Number 96-056. The technology enables finely controlled relative motion for focusing or scanning a specimen relative to an optical system such as a microscope, measuring instrument IC stepper, etc. Any parties interested in the further development or licensing of the technology described above may write to: Ernie Graf, National Institute of Standards and Technology, Building 820, Room 213, Gaithersburg, MD 20899. This is not an announcement of a contract or grant.

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