Department of Commerce, Mountain Administrative Support Center, Procurement Division, MC3, 325 Broadway, Boulder, CO 80303-3328

66 -- ELECTRON BACKSCATTERING DIFFRACTION SYSTEM SOL NB853000703015MB DUE 012197 POC Michelle A. Bernal, (303)497-3983 FAX# (303)497-3163 The National Institute of Standards & Technology (NIST), requires an electron backscattering diffraction image and data analysis system. Critical specifications as follows: Hardware: 1)Lowlight (light sensitivity of at least 1 X 10 minus 5 lux) camera with phosphor screen, capable of capturing and displaying: a live diffraction pattern image at an electron beam current of 2 to 3 nano-amps or less; an integrated, background-subtracted diffraction pattern image at an electron beam current of 0.2 to 0.3 nano-amp or less. 2)SEM/camera interface including: motorized or manual control of camera position, with camera remaining in focus at all positions; simultaneous viewing of diffraction pattern and secondary electron image; forward scatter electron detector (multiple panel preferred, single panel acceptable); 70 degrees tilted specimen holder; and system must interface to JEOL 6100 SEM. 3)Automated SEM stage control and beam control. Software: 1)Analysis software capable of automatic diffraction pattern recognition and indexing for all crystal symmetries. Imaging/mapping capable of images with intensities or colors indicating differences in orientation and intensity-coded or color-coded images displaying grain boundary characteristics such as misorientation angle and CSL values. Interested sources may request a copy of the RFQ either by mail or fax. See Note 1. (0351)

Loren Data Corp. http://www.ld.com (SYN# 0202 19961219\66-0006.SOL)