Naval Research Laboratory, Code 3220, 4555 Overlook Ave. S.W., Washington, D.C. 20375-5326

66 -- SCANNING ELECTROSCOPE MICROSCOPE SYSTEM SOL N00014-97-R-HA02 POC Hilda R. Abdon, Contract Specialist, Code 3220.HA, Contracting Officer, Kevin M. King, (202) 767-2550 The Naval Research Laboratory (NRL) has a requirement for a scanning electron microscope (SEM) system. The SEM must have a field emission electron source to provide high resolution at both high and low accelerating voltages. The system will provide for digital image acquisition and output. Several fully integrated optional components are being considered to complement the system. The two principal options are an electron backscatter pattern (EBSP) component for grain orientation mapping and an energy dispersive x-ray spectrometer (EDS) for chemical analysis (including light elements). The SEM must be configured to provide for high EBSP performance with high beam current, high specimen tilt angle, and minimal pattern distortion by the microscope lens system. Additional options will include: a large specimen chamber to accommodate larger specimens and larger specimen traverse dimensions; several image, pattern, and spectrum recording devices; and software capabilities. The requirements is for a multipurpose, multi-user system and proposals will be evaluated for optimal performance in this environment. A firm fixed price contract award is anticipated. (0024)

Loren Data Corp. http://www.ld.com (SYN# 0236 19970128\66-0002.SOL)