National Institute of Standards & Technology, Acquisition & Assistance Div., Bldg. 301, Rm B117, Gaithersburg, MD 20899

66 -- SURFACE FINISH MEASURING INSTRUMENT SOL 53SBNB760211 DUE 071897 POC Contracting Officer, Romena R. Moy -- (301) 975-4999, Contract Specialist, Tamara Grinspon -- (301) 975-4390 WEB: NIST Contracts Homepage, http://www.nist.gov/admin/od/contract/contract.htm. E-MAIL: NIST Contracts Office, Contract@nist.gov. The National Institute of Standards and Technology (NIST) has a requirement for a quantity of one (1) Stylus Type Surface Finish Measuring Instrument. THIS IS A COMBINED SYNOPSIS/SOLICITATION FOR COMMERCIAL ITEMS PREPARED IN ACCORDANCE WITH THE FORMAT IN FAR SUBPART 12.6, AS SUPPLEMENTED WITH ADDITIONAL INFORMATION INCLUDED IN THIS NOTICE. THIS ANNOUNCEMENT CONSTITUTES THE ONLY SOLICITATION ; QUOTATIONS ARE BEING REQUESTED, AND A WRITTEN SOLICITATION DOCUMENT WILL NOT BE ISSUED. This solicitation, #53SBNB760211, is a Request for Quotation (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular 46. The associated Standards Industrial Classification Code (SIC) for this procurement is 3823, and the small business size is 500 Employees. The FOB Point shall be Destination, Gaithersburg, Maryland. Delivery is required within six (6) weeks after receipt of order (ARO). Delivery location is the National Institute of Standards and Technology (NIST), Building 301, Receiving Room, Gaithersburg, Maryland 20899-0001. Acceptance location will be NIST. The following specifications represent the Government's minimum requirements. Offerors may, in addition, propose any special options or additions, which will be considered by the Government. The contractor shall provide a stylus-type surface finish measuring instrument to be used in the Fabrication Technology Division (FTD) at the National Institute of Standards and Technology (NIST). FTD supports many different types of projects at NIST by fabricating parts and building scientific apparatus. This instrument will be used to measure the surface finish of high precision machined components fabricated in FTD. The instrument will also be used as a training aid in our machining technology program. Because the instrument will be used by many different operators, the instrument shall be "user friendly" and resistant to damage. The instrument shall consist of a mechanical assembly to hold and precisely move the stylus probe across the surface to be measured, plus a computer/printer system for data acquisition, data reduction, presentation of results, and communication/control of the complete instrument. The instrument shall be a complete "turn-key" system, easy to set-up and operate. All hardware, software, cables, and accessories needed to calibrate and make surface finish measurements shall be included as part of the basic instrument package. Stylus Probe and z-Direction Motion: The stylus probe shall be easily removeable and replaceable. A preferred design is a breakaway-type that minimizes the chances of destroying the probe when inadvertently running into a part. The unit shall include a minimum set of probes, as follows: basic type probe with a 2 micrometer or smaller tip radius, groove bottom type probe with at least 10mm long tip, transverse chisel type probe for small OD measurements (one of each type of probe required). Measuring Force: The static measuring force exerted on the surface being measured shall be 200 mg (2 mN) or less. The static measuring force shall be measured at the midpoint of the z range of the instrument. Measuring Resolution: The measuring resolution is the smallest z profile height increment detectable by the probe. The measuring resolution shall be at least 0.01 micrometer. Measuring Range: The measuring range shall be at least 1 mm of travel for the probe in the z direction. (The horizontal range is specified below in the linear motion section). Linear Motion Drives: The horizontal or x-Axis motion of the stylus shall be provided by the instrument meeting the following minimum specifications: Traverse Length: The traverse length in the x-direction shall be adjustable from 0.5 mm to 100 mm. Traverse Speeds: There shall be at least two speeds: 2.5 mm/sec and 0.25 mm/sec. x-Axis Straightness: The x-axis straightness is the measure of departure from a straight line of a trace of a perfect reference guide or straight edge. The x-axis straightness shall be a maximum of 1 micrometer over 100 mm of traverse length. Computer System: The instrument shall include a computer for data acquisition, data analysis, and communication/control of the entire instrument. The computer and monitor shall be an up-to-date system with a minimum of 486DX, 100Mhz processor, 1.0 GB hard drive, 3.5 inch floppy drive, and a minimum of 4 MB of RAM. An instrument and software that uses a touch-screen color monitor is preferred. A printer capable of outputting results (both graphical and alphanumeric) is required. A laser type printer is preferred; however, a dot matrix printer is acceptable. Set-up and Measurement Parameters: Leveling Screen: The instrument shall include a leveling screen to prompt the operator with simple on-screen instructions for adjusting the linear drive to be level relative to the workpiece. Re-Calculate Capability: The instrument shall have the feature that will permit the same gathered set of raw profile data to be re-calculated with additionally selected parameters or with various cutoffs without having to stroke the surface again with another measurement. Measured Surface Parameters: The instrument shall be capable of calculating specified parameters from the raw data profile of a surface taken by the instruments stylus probe. All definitions of the surface parameters shall be derived from the newest revision of ASME B46.1. The instrument shall be capable of calculating and presenting the following parameters from the unfiltered profile, filtered roughness and filtered waviness. Unfiltered Profiles: PRa, PRq, Pt, PRp, PRv, Rz(ISO), Ptp, PSm, PS, PPc, PHSC, PRsk, PRku, P(lamda)q, P(Delta)q, ADF, BAC, TIR1, TIR2. Filtered Roughness: Ra, Ra min, Ra max, Rq, Rz(DIN), R3z, R3z1-R3z5, Rmax, Ry, Ry aver, Ry min, Rz(ISO), rp(ISO), tp, Htp, Sm, S, Pc, HSC, Rsk, Rku, (lamda)q, (Delta)q, ADF, BAC, Rk, Rvk, Mr1, Mr2, Ap, Av. Filtered Waviness: Wa, Wq, Wt, Wp, Wv, (lamda)q, (Delta)q, TIR1, TIR2. Special Software Capabilities: The instrument shall have the capability of performing the following analysis screens: Crown Drop: For evaluation of roller bearings with the results for crown drop left and right values including radius. This is to include operator controls for setting evaluation range, center line and evaluation distances: Segment Analysis: For evaluation of interrupted surfaces with results for Ra, Rq, Ry and Wt. This is to include operator controls to "include" selected segments or to "exclude" known surface defects. TIR Analysis: To permit the operator to use an "electronic template" to scroll and zoom in on any portion of the selected waviness or leveled profile for TIR assessment over the complete traverse or any segment of it. Profile Analysis: To permit the operator to observe two different profiles and to scroll through and zoom in on any portion of the profile. tp/BAC Analysis: To provide post process analysis capability tp assess the tp% values at any given cutting level including Htp. ADF Analysis: To display the amplitude density curve and calculated Rsk and Rku values. Table/Stand: The instrument shall include a motorized height-adjustment mounted on a suitable granite plate with minimum dimensions of 500 mm by 750 mm by 100 mm. The instrument shall include a motorized height stand mounted to the granite surface plate. The motorized height adjustment shall allow travel from 25 mm to 200 mm above the surface of the granite surface plate. A hand held pendent for raising and lowering the platform is preferred. The instrument shall include a welded steel stand with vibration-isolation leveling feet for support of the granite plate and motorized height stand. Calibration and Reference Specimen: Two precision certified reference artifacts shall be included with the instrument for calibrating the instrument and verifying proper operation. A sinusoidal artifact with Ra = 3.0 micrometer and a step artifact with a 5.0 micrometer step are preferred. Strip Chart Recorder: The instrument shall be capable of outputting results both graphical and alphanumeric to a thermal strip chart recorder. The strip chart shall have the following magnifications: Horizontal: from 0.5X to 10,000X and Vertical : from 100X to 200,000X. Instruction/Reference Manual: Three (3) copies of all instruction and reference manuals shall be included. The manuals shall include operating instructions, general maintenance and cleaning procedures, calibration and set-up instructions and surface parameter descriptions. Electrical Supply and Environment: The instrument shall operate on 110 volt, 60 Hz, single phase electrical power. Any special electrical power quality requirements, or special environment requirements other than normal inspection room conditions, shall be specified in the installation and set-up instructions. Warranty: A one-year warranty shall be supplied for this system that covers all components of the system. The following FAR provisions apply to this solicitation: 52.212-1, Instructions to Offerors-Commercial; 52.212-2, Evaluation-Commercial Items. Evaluation Criteria to be included in paragraph (a) of provision 52.212-2 are as follows: Technical Capability to Meet or Exceed Specifications, Past Performance, and Price. Technical evaluation criteria, when combined, are significantly more important than price. All vendors are to include with their quotes, a completed copy of provision 52.212-3, Offeror Representations and Certifications-Commercial Items. The following FAR clause applies to this acquisition: 52.212-4, Contract Terms and Conditions-Commercial Items. The following additional FAR clauses, which are cited in clause 52.212-5(a) are applicable to this acquisition and (b) as follows: 52.222-26, Equal Opportunity; 52.222-35, Affirmative Action for Special Disabled and Vietnam Era Veterans; 52.222-36, Affirmative Action for Handicapped Workers; 52.222-37, Employment Reports on Special Disabled Veterans and Veterans of the Vietnam Era; 52.225-3, Buy American Act-Supplies; 52.225-21, Buy American Act, North American Free Trade Agreement Implementation Act-Balance of Payments Program. Department of Commerce Agency-Level Protest Procedures Level Above the Contracting Officer (DEC 1996) are hereby incorporated by reference (see http://www.nist.gov/admin/od/contract/protest.htm for access to the full text thereof). All quotes should be sent to the National Institute of Standards and Technology, Acquisition and Assistance Division, Building 301, Room B117, Gaithersburg, Maryland 20899-0001, Atten Tamara Grinspon, Solicitation No. 53SBNB760211. Copies of above-referenced clauses are available upon request, either by telephone or fax. All responsible, interested firms may submit a quote by 3:00 PM, Washington, DC time, on July 18, 1997. Faxed quotations will NOT be accepted. (0183)

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