Crane Division, Naval Surface Warfare Center, Code 1164, 300 Highway 361, Crane, In 47522-5001

66 -- SCANNING PROBE MICROSCOPE SYSTEM SOL N00164-97-Q-0323 DUE 080897 POC Ms. Hilda Quillen Procurement Technician, phone 812-854-2422, fax 812-854-5666, e-mail quillen_h@crane.navy.mil E-MAIL: Click here to contact purchasing agent, wood_bk@crane.navy.mil. Solicitation number N00164-97-Q-0323 is extended to 8 Aug 1997 and the salient characteristics for the Scanning Probe Microscope System from the original combined are revised as follows: Background. The Scanning Probe Microscope (SPM) system described below will be used to analyze the mechanical property differences between aged and unaged plastic bonded explosives, propellants and pyrotechnics. The system will be an Atomic Force Microscope (AFM) system that will provide force modulation and phase detection capabilities. The system will provide contact, non-contact and intermittent contact AFM. Access to Explosives Sciences Branch technical applications can be included as part of the system procurement. Requirements. The minimum required performance salient characteristics of the system include the following: The SPM shall consist of controller, stage, electronics, scanning head, software, high-performance active noise cancellation system, cantilevers and chip carrier. The SPM system shall include software for data acquisition and image processing, data analysis and presentation for all modes as required by this specification. The contractor shall also perform installation of the SPM system at NSWC Crane and shall provide training by a systems engineer for Government personnel. The operating system shall include at a minimum: 100 MHZ Pentium computer with Windows 95 operating system or equivalent, 16 MB RAM, 1.0 GB hard disk, 1.4 MB floppy drive, 17" high-resolution color monitor, and control electronics for the SPM. The SPM system shall include large-sample size motorized stage with at least 2.5 micron resolution with computer control. The system shall include an optical microscope which provides on-axis optical view of both the cantilever and the sample for more versatility in sample positioning and general ease of use. It shall include a 2-x objective lens for use with the optical microscope. A video imaging system of the sample shall also be included. The camera system shall consist of a minimum 18 inch color video monitor with 1.5 micron resolution that provides real time, on-axis view of sample and tip. The SPM microscope head shall be a system capable of multiple modes of operation: contact, intermittent-contact, non-contact AFM, LFM, phase contrast and force modulation. These modes shall be fully supported by the system and all components and software necessary to run these modes shall be supplied with the system. Electronics that provide complete feed back for flexibility and accuracy in control of the top-sample separation shall be supplied with the system. The scan ranges required are: x, y up to 100 microns -- z range 7 microns. They shall be complete with calibration grid. The system shall include an isolation table specified for use with ambient SPM's as well as an assortment of cantilevers for C-AFM (25), IC-AFM and NC-AFM (50). (0203)

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