Supply Department, U S Naval Academy, 181 Wainwright Road, Annapolis, MD 21402-5007

66 -- INTEGRATED TRANSIENT/STRUCTURAL ANALYSIS TEST SYSTEM SOL N00161-98-Q-0045 DUE 020998 POC Mrs. Kathleen M. H. McCloskey (410) 293-3520/Fax (410) 293-5293 Procurement of a Turnkey Integrated Transient/Structural Analysis Test System. Multi-channel, expandable test system for the acquisition and analysis of mechanical test data. It should be a turn-key, integrated station implementing a combination of controller, processor, data acquisition, display, and software for control, as well as real-time and post processing of acquired data. The system shall be useable in both laboratory and field environments, requiring a notebook/docking station configuration. This will also allow the PC controller to be used stand-alone for further data analysis with or without the acquisition portion of the system. All aspects of the system (controller, expansion chassis, Data Aq/FFT cards, control software, and structural analysis software) will be integrated/installed, tested, and verified for proper operation prior to shipment. Start-up assistance and training also to be provided. Complete specifications to be listed in solicitation N00161-98-Q-0045. Requests for solicitation packet may be either telephoned in, faxed in or mailed in. See Note 1. (0364)

Loren Data Corp. http://www.ld.com (SYN# 0158 19980102\66-0004.SOL)