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COMMERCE BUSINESS DAILY ISSUE OF FEBRUARY 9,1998 PSA#2028DEVELOPMENTS AT NIST Researchers at the National Institute of Standards
and Technology (NIST) have developed a number of new devices and
methods involving a variety of technologies. In certain cases other
parties have participated in the development of these technologies.
NIST may enter into a Cooperative Research and Development Agreement
(CRADA) with interested parties to perform further research on the
invention for purposes of commercialization. NIST may grant CRADA
Partners an option to negotiate for exclusive licenses to any jointly
owned inventions which arise from the CRADA as well as an option to
negotiate for exclusive royalty-bearing licenses for NIST employee
inventions which arise from the CRADA. Anyone interested in the further
development of any of these technologies or in applying for a license
to commercialize these technologies should send a written request for
further information, referencing the NIST Docket Number and Title, to:
National Institute of Standards and Technology, Industrial
Partnerships Program, Building 820, Room 213, Gaithersburg, Maryland
20899; Telecopy: 301-869-2751. This is not an announcement of a
contract action or a grant. NIST DOCKET NUMBER: 96-007CIP, Title:
Monocrystalline Test and Reference Structures and Use for Calibrating
Instruments, Description: A test structure for measurement of width of
conductive lines formed on substrates as performed in semiconductor
fabrication, and a referenced grid for calibrating instruments for such
measurements. A monocrystalline surface layer is etched to define the
test structure. The substrate is then removed to form a transparent
window allowing for inspection by transmissive-optical techniques and
for correlation of electrical, optical, and other measurements. NIST
DOCKET NUMBER 97-046PA, Title: An Efficient Drift Correction Procedure,
Description: This invention is a numerical methodology to diagnose the
low frequency noise-drift-encountered in an analytical experiment,
using repeated measurements and a model of the instrument response.
This invention is available for commercial use without a license. WEB:
NIST Contracts Homepage,
http://www.nist.gov/admin/od/contract/contract.htm. E-MAIL: NIST
Contracts Office, Contract@nist.gov. Loren Data Corp. http://www.ld.com (SYN# 0462 19980209\SP-0005.MSC)
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