Loren Data Corp.

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COMMERCE BUSINESS DAILY ISSUE OF FEBRUARY 9,1998 PSA#2028

DEVELOPMENTS AT NIST Researchers at the National Institute of Standards and Technology (NIST) have developed a number of new devices and methods involving a variety of technologies. In certain cases other parties have participated in the development of these technologies. NIST may enter into a Cooperative Research and Development Agreement (CRADA) with interested parties to perform further research on the invention for purposes of commercialization. NIST may grant CRADA Partners an option to negotiate for exclusive licenses to any jointly owned inventions which arise from the CRADA as well as an option to negotiate for exclusive royalty-bearing licenses for NIST employee inventions which arise from the CRADA. Anyone interested in the further development of any of these technologies or in applying for a license to commercialize these technologies should send a written request for further information, referencing the NIST Docket Number and Title, to: National Institute of Standards and Technology, Industrial Partnerships Program, Building 820, Room 213, Gaithersburg, Maryland 20899; Telecopy: 301-869-2751. This is not an announcement of a contract action or a grant. NIST DOCKET NUMBER: 96-007CIP, Title: Monocrystalline Test and Reference Structures and Use for Calibrating Instruments, Description: A test structure for measurement of width of conductive lines formed on substrates as performed in semiconductor fabrication, and a referenced grid for calibrating instruments for such measurements. A monocrystalline surface layer is etched to define the test structure. The substrate is then removed to form a transparent window allowing for inspection by transmissive-optical techniques and for correlation of electrical, optical, and other measurements. NIST DOCKET NUMBER 97-046PA, Title: An Efficient Drift Correction Procedure, Description: This invention is a numerical methodology to diagnose the low frequency noise-drift-encountered in an analytical experiment, using repeated measurements and a model of the instrument response. This invention is available for commercial use without a license. WEB: NIST Contracts Homepage, http://www.nist.gov/admin/od/contract/contract.htm. E-MAIL: NIST Contracts Office, Contract@nist.gov.

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