U.S. Environmental Protection Agency, 26 W. Martin Luther King Dr., Cincinnati, OH 45268

66 -- LOW VACUUM SYSTEM SCANNING ELECTRON MICROSCOPE SOL ORD-11 DUE 040198 POC Hans Schellhas E-MAIL: Hans Schellhas, schellhas.hans@epamail.epa.gov. The US EPA intends to negotiate on a sole source basis, under authority of FAR 6.302, with JEOL USA, Inc, for the acquisition of a turnkey, installed digital, computer controlled, variable vacuum pressure, scanning electron microscope (SEM). This system will include the following JOEL items: JSM-5800LV, MP-80070(LBG), MP-87010(EXT), GW-IRCS, R033SP/W, LK-L300QI, LK-B-12, LK-L240/NNN, LK-L250/NNN. The basis for the sole source negotiation is the Government's requirement for a low vacuum system SEM which is capable of fully integrating images with quantitative EDS analyses of a diverse range of environmental samples, including large sections of core, which can be viewed on a eucentric stage, and will not require a coating of conductive material. A dual vacuum pumping system is required, dedicated to either high or differential vacuum modes, which will prevent contamination of the electron source by compounds typically degassed by many environmental samples when under vacuum, and by diffusion pump oil which may backstream into the sample chamber and/or column during routine operation. A dedicated foreline contamination trap in the design of the Low Vacuum SEM is also required. The system shall be able to store up to 160 positions in memory, have the capacity to store large 200 mm samples weighing up to 5Kg, and allow the flexibility afforded by digital magnification in over 130 discrete steps. Another unique capability afforded by the system will be both elemental and topographical imaging of irregular surfaces using proprietary JEOL Ashadow@ diode technology, built-in high resolution (1024x1024) video printer, and dual condenser lenses with zoom condenser which makes it possible to vary spot size selection with no image beam shift, need to refocus or bias modification. The system should provide a five axis, digital eucentric tilt stage which maintains focus, magnification and appropriate field of view at all working distances, with motorized X,Y and Z travel distances of at least 100, 100 and 40 mm respectively. The SEM should be configured for optimum EDS operation by having a 35 degree take-off angle at a short working distance of 10 mm, thereby providing the highest X-Ray angle at the shortest working distance currently available. THIS IS NOT A REQUEST FOR PROPOSALS. Only sources capable of providing a SEM system which fully meets the unique technical performance capabilities outlined above, without exception, will be considered. Those wishing to be considered must submit complete technical documentation to the office identified above. Documentation must be submitted within 15 days of the publication of this notice. The point of contact is Hans Schellhas or Marie Nichols. The subject facsimile number is (513) 487-2107. (0048)

Loren Data Corp. http://www.ld.com (SYN# 0259 19980220\66-0001.SOL)