NASA/Langley Research Center, Mail Stop 144, Industry Assistance Office, Hampton, VA 23681-0001

66 -- FOCUS SCANNING INTERFEROMETRIC MICROSCOPE SOL 1-168-DMH.1542 DUE 062398 POC Kimberly D. Duncan, Purchasing Agent, Phone (757) 864-3566, Fax (757) 864-8863, Email k.d.duncan@larc.nasa.gov -- James W. Cresawn, Contract Price Analyst, Phone (757)-864-2500, Fax (757) 864-7898, Email J.W.CRESAWN@larc.nasa.gov WEB: Click here for the latest information about this notice, http://nais.nasa.gov/EPS/LaRC/date.html#1-168-DMH.1542. E-MAIL: Kimberly D. Duncan, k.d.duncan@larc.nasa.gov. Focus Scanning Interferometric Microscope:Specifications: Microscope system for microsurface and microcrack mapping with extended scanning: Tall Toolmakers Stand, X-Y Translation Stage, Piezoelectric Platform with 100 micron scanning range; Trinocular Head with 10X eyepieces; 50-Watts quartz halogen light source with variable P.S.; Minimum 384x244 digitized data point; DSP based Video Digitizer Board; Motorized Interference Filter Selector; Computer controlled video gain and offset control; PZT amplifier and LCD display of scan position; Low noise CCD camera unit; Surface mapping software; Video monitor, 9, B&W; PC based control unit; 20X Mirau Objective: Functions: System functions must ensure measurements of micro-crack depth and width: Single wavelength interferometry- selectable in software which automatically moves the motorized filter between modes of operation for high precision angstrom level measurements; Dual wavelength interferometry; Confocal mode imaging- a byproduct of the phase detection process to obtain high contrast microscopic images. The signal-to-noise ratio of these images is much greater than that of a conventional microscopic image; DIC with operational accessories; Better data acquisition- the user can adjust the gain level and use Auto Gain to maximize the amplitude width of the signal to create the best fringe contrast possible for minimizing data dropouts; Field calibration by user; Automatic fine fringe focusing; Motorized filter; LCD display; Stage assembly scan motion; LDVT Feedback of PZT motion; Smart turret- automatically changes the magnification in software; Binocular eyepieces; Normal microscopy mode (viewing without fringes); Camera rotation- allows the user theta adjustment.; Live Active Video- displayed on computer monitor.; Controller- PC based; Detect analysis- with detect analysis the user can isolate a group of defects and enhance their visibility. The dynamic zoom must be necessary for a display of magnified inset of a selected subset which can be dynamically moved anywhere in the data area; Fourier Transform Filtering- This filter should allow the user a visual graphic method of inputting the high and low frequency cutoffs to extract the band of information of interest. The filtering must be performed using a Fourier Transform which is more precise than using digital (spatial domain) implementation; Relief Map- must utilize 1-1 sampling, and allow the user to change the software simulated lighting angle and intensity, to control the amount of surface detail viewed; Area Difference Plots- the function should provide up to nine different areas which can be moved individually around the data set in real time. Statistics of the individual areas are then compared and plotted using a bar graph which indicates the height differences between areas; View Report- Statistical data should be filtered and its format should be saved; Universal Data Files (UDF)- must be used for easy porting; Help Text- this function must guide the user for a concise explanation of each parameter selected; Postscript Graphics; Summit-Valley Analysis- must allow user complete control to define peaks and valleys of micro-cracks for counting and area definition; Rolled Sheet Analysis- must provide parameters calculated in single direction using multiple traces in both the longitudinal and transverse directions. This notice is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; quotes are being requested and a written solicitation will not be issued. This procurement is being conducted under the Simplified Acquisition Procedures (SAP). Focus Scanning Interferometric Microscope, one each The provisions and clauses in the RFQ are those in effect through FAC 97-04. This procurement is a total small business set-aside. See Note 1. The SIC code and the small business size standard for this procurement are 3826 and 500 employees, respectively. The quoter shall state in their quotation their size status for this procurement. All qualified responsible business sources may submit a quotation which shall be considered by the agency. Delivery to NASA Langley Research Center is required within 60 days ARO. Delivery shall be FOB Destination. The DPAS rating for this procurement is DO-C9. Quotations for the items(s) described above may be mailed or faxed to the identified point of contact, by the date/time specified and include, solicitation number, FOB destination to this Center, proposed delivery schedule, discount/payment terms, warranty duration (if applicable), taxpayer identification number (TIN), identification of any special commercial terms, and be signed by an authorized company representative. Quoters are encouraged to use the Standard Form 1449, Solicitation/Contract/Order for Commercial Items form found at URL: http://procure.arc.nasa.gov/Acq/Standard_Forms/Index.html to submit a quotation. Quoters shall provide the information required by FAR 52.212-1. Please note that payments are to be made by electronic funds transfer, accordingly, you must provide the mandatory information for electronic funds transfer with your representations and certifications. Failure to provide this information may delay or prevent the receipt of payments through the Automated Clearinghouse Payment System. If the end product(s) quoted is other than domestic end product(s) as defined in the clause entitled "Buy American Act -- Supplies," the quoter shall so state and shall list the country of origin. The Representations and Certifications required by FAR 52.2l2-3 may be obtained via the internet at URL: http://ec.msfc.nasa.gov/msfc/pub/reps_certs/sats/ FAR 52.212-4 is applicable. Addenda to FAR 52.212-4 are as follows: 52.214-34, 52.214-35, 52.219-6, 1852.215-84, 1852.225-73 FAR 52.212-5 is applicable and the following identified clauses are incorporated by reference. 52.222-3, 52.233-3, 52.222-26, 52.222-35, 52.222-36, 52.222-37, 52.225-3 Questions regarding this acquisition must be submitted in writing no later than June 17, 1998. Quotations are due by Noon, local time, June 23, 1998 to the address specified above. Selection and award will be made (on an aggregate basis) to the lowest priced, technically acceptable quoter. Technical acceptability will be determined by information submitted by the quoter providing a description in sufficient detail to show that the product quoted meets the Government's requirement. Quoters must provide copies of the provision at 52.212-3, Offeror Representation and Certifications -- Commercial Items with their quote. See above for where to obtain copies of the form via the Internet. An ombudsman has been appointed -- See Internet Note "B". It is the quoter's responsibility to monitor this site for the release of amendments (if any). Potential quoters will be responsible for downloading their own copy of this combination synopsis/solicitation and amendments (if any). (0160)

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