National Institute of Standards & Technology, Acquisition & Assistance Div., Bldg. 301, Rm B117, Gaithersburg, MD 20899

66 -- FIELD EMISSION GUN ANALYTICAL SCANNING AUGER MICROPROBE SYSTEMS SOL 53SBNB960003 DUE 103098 POC Contracting Officer, Pauline E. Mallgrave, (301) 975-6330; Contract Specialist, Tamara Grinspon, (301) 975-4390 WEB: NIST Contracts Homepage, http://www.nist.gov/admin/od/contract/contract.htm. E-MAIL: NIST Contracts Office, Contract@nist.gov. The National Institute of Standards and Technology (NIST) has a need for a quantity of two (2) FIELD EMISSION GUN ANALYTICAL SCANNING AUGER MICROPROBE (FEASAM) SYSTEMS.*****Both FEASAM systems shall be an integral part of ongoing NIST microanalysis research programs that include: calibration and characterization of standards; measurement of fundamental data involved in electron scattering, electron energy loss, Auger electron emission, and characteristic x-ray production; development of analytical methods and data reduction procedures to enable new types and more accurate quantitative Auger electron and x-ray emission analyses; microparticle and layered specimen characterization; automated and telepresence microscopy; certification of Standard Reference Materials; and a wide variety of materials and environmental applications.*****The first FEASAM system (CLIN ITEM #001) shall be capable of conventional Auger electron spectroscopy (AES) and scanning electron microscopy (SEM). It shall include an electron microscope column having a field emission source and full function digital computer control and digital imaging capabilities. It shall be capable of having the following analytical and imaging modes simultaneously-attached: Auger electron spectrometry (AES), energy dispersive x-ray spectrometry (EDS), wavelength dispersive x-ray spectrometry (WDS), x-ray photoelectron spectrometry (XPS), reflected electron energy loss spectroscopy (REELS) for incident energies less than 2.5 keV, secondary electron imaging (SEI), backscattered electron imaging (BEI), Auger electron imaging (AEI), reflected electron energy loss imaging (REELI), and x-ray imaging (XRI). The system shall be capable of having attached (simultaneously with the above items) a variable energy ion gun (for cleaning and depth profiling). The hardware for the specified analytical and imaging modes should be attached to the FEASAM and the software should allow images and analyses to be acquired for selected regions of the sample.*****The second FEASAMsystem (CLIN ITEM #002) shall be a high performance, research grade, ultra-high vacuum, field emission analytical scanning Auger microprobe system including special flange and modifications to accommodate Scanning Electron Microscopy with Polarization Analysis (SEMPA) instrumentation. The system shall be capable of conventional Auger electron spectroscopy (AES) and scanning electron microscopy (SEM). It shall include an electron microscope column having a field emission source and full function digital computer control and digital imaging capabilities. It shall be capable of having the following analytical and imaging modes simultaneously-attached: Auger electron spectrometry (AES), secondary electron imaging (SEI), backscattered electron imaging (BEI), and Auger electron imaging (AEI). The system shall be capable of having attached (simultaneously with the above items) a variable energy ion gun (for cleaning and depth profiling). The hardware for the specified analytical and imaging modes should be attachedto the FEASAM and the software should allow images and analyses to be acquired for selected regions of the sample.*****Delivery is required within nine months after receipt of order (ARO). The FOB point for deliverables is Destination, Gaithersburg, MD.*****The Government anticipates awarding a purchase order to the responsible offeror whose quotation represents the best value to the Government, price and other factors considered. The Government reserves the right to award multiple purchase orders.*****THIS REQUIREMENT IS SUBJECT TO THE AVAILABILITY OF FUNDS.*****Request for Quotation (RFQ) Packages will be available to all interested, responsible firms. Please Fax Requests for a Quotation Package Number 53SBNB960003 to Fax Number: (301) 963-7732. Posted 10/09/98 (W-SN260904). (0282)

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