Naval Research Laboratory, Code 3220, 4555 Overlook Ave. S.W., Washington, D.C. 20375-5326

66 -- SCANNING PROBE MICROSCOPE STATION SOL N00173-99-R-JR01 POC Jerry Riles, contract Specialist, Code 3220.JR, (202) 767-2120, Wayne Carrington, Contracting Officer WEB: click here, http://heron.nrl.navy.mil/contracts/home.htm. This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in Federal Acquisition Regulation Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. This solicitation, N00173-99-R-JR01, is a request for proposal (RFP). The incorporated provisions and clauses of this acquisition are those in effect for Federal Acquisition Regulation (FAR) and Federal Acquisition Circular 97-08 (excluding 97-07) and for Defense Federal Acquisition Regulation Supplement (DFARS) through Defense Federal Acquisition Regulation 91-13. The small business size standard for this acquisition is 500 and the SIC code is 3827. This acquisition is unrestricted. The Naval Research Laboratory (NRL) has a requirement for CLIN 0001, Scanning Probe Microscope" for intergration with a Zeiss Axiovert Optical Microscope. The Scanning Probe Microscope system must exhibit molecular scale image resolution while connected to a Zeiss Axiotech optical microscope. 1. General Performance Characteristics: 1.1. The system must be able to measure steps in the z direction of less than 1 nanometer (nm). Hence, the RMS noise of the installed will be less than 0.15 nm over a 0.05 Hz -- 100 kHz bandwidth with the cantilever on a coverslip in water and loaded to a force > 5 nN. The vendor must provide adequate vibration and acoustic isolation to meet this goal. 1.2. The system must operate in several different modes, including: Noncontact mode, Contact Mode, Lateral Force, Magnetic Force, Electric Field, Surface Potential, and Force Volume Imaging Mode. 2. System Controller and Electronics Interface: 2.1. The system shall have three independent 16 bit digital to analog converters (DACs) per scan axis (x, y, and z for a total of 9). On a per scan axis basis one DAC shall be used to scale scan size, the second DAC shall be used to scale scan pattern, and the third DAC shall be used for scan offset. 2.2. The feedback control of the tip-sample separation must be digital for sufficient flexibility and accuracy of control. 2.3. Disable/enable slow scan axis for optimizing feedback parameters along a single line scan. The system must allow for a choice of logarithmic (STM) or linear (AFM) feedback response, and provide the capability to select from the following input filters and gain types: integral, proportional, or digitally expressed functions. These input filters must include the ability to perform real-time scan linearization and to utilize the information from the preceding scan to allow the tip to anticipate features in the current scan (2-D, also known as look-ahead gain). 2.4. The operating environment for the scanning probe microscope control interface must allow for real-time response. Hence, the system must allow true 32 bit processing with pre-emptive multitasking. 2.5. The feedback and scan drive functions must have adequate performance for the following: Alateral scan rate of > 500 microns per second with a 90 micron or greater scanner, with real-time scan linearization active. 2.6. The system shall be able to perform a lift mode operation when measuring long-range force field gradients emanating from the sample surface. Examples of these long-range force field gradients are electric/coulombic forces and magnetic forces. The lift mode shall perform as follows: topography is determined on the first pass over a scan line, then the tip is lifted some user defined height off the surface and the exact same scan line is traced again, keeping a constant (user defined) separation between tip and sample surface. During this second pass, the tip interacts with, and measures, the long-range force field gradient. The use of this mode virtually eliminates any convolution of topographic features with the desired force gradient information. The use of methods which simply skim the tip some height above the sample without regard to topography, shall be considered unacceptable. 2.7. The system shall provide an option to perform non-square scans of the specimen surface. The aspect ratio for these non-square scans shall be user selectable from 1:1 to 1:32. This feature enables efficient operation of the microscope. 2.8 Minimum hardware requirements include: Pentium II processor, 450 mhz, 128MB RAM, 9GB hard drive, 32x CD-ROM, zip drive, 1.44MB 3.5" flopply drive, 17" color monitors (15.9" viewable, 28 dpi).3. Scanner Performance and Linearization: 3.1. The system shall provide a piezoelectric ceramic tube scanner constructed of two piezo tubes bonded together. The piezoelecteric ceramic material used in these tubes must be optimized for sensitivity and linearity during the x,y and z motion of the scanner. This design must provide <1% change in z piezo sensitivity ("derating") for a 5 angstrom step height after calibrating the scanner with a 180 nanometer standard calibration reference. 3.2. The system shall have a real-time scan linearization which provides a calibrated non-linear waveform to the peizoelectric scanner achieving a linear output for all scan sizes (2 nanometers to > 90 microns) and scan rates. 3.3. The scan head design shall incorporate an easily changeable cantilever holder. For tip oscillation modes (such as TappingMode AFM, Electric Force Microscope, Phase Imaging, etc.), the oscillation of the probe shall be user selectable over a range of RMS amplitudes from DC to over 500 nanometers peak-to-peak, at frequencies from DC up to 1 MHz. The system shall be capable of future upgrades to enable additional modes of operation to be implemented, such as: Scanning Thermal Microscopy, Nanoindentation, Nano-SRP and Scanning Tunneling Microscopy. These modes may require some hardware upgrades, but must not require a separate computer and/or control electronics. All software upgrades shall be provided free of charge for the life of the instrument. All equipment shall be warranted in accordance with standard commercial practices. The warranty period shall begin after acceptance of the system. The offeror must provide complete installation of the system and provide a Demonstration of all system capabilities during the initial installation. On-site training must be provided immediately following completion of system installation. The training shall be no more than two (2) days. The vendor will be required to certify that the offered equipment and software will perform precisely as described in this specification. All capabilities must be demonstrated during the initial installation and will be reviewed prior to final acceptance of the instrument. Delivery and acceptance is the Naval Research Laboratory, 4555 Overlook Ave. S.W. Washington, DC 20375-5326, FOB Destination, no later than 90 days from date of award. The FAR and DFAR provisions and clause sited herein are incorporated by reference into this solicitation. Offerors are advised to propose in accordance with the provision at FAR 212-1, Instructions to Offerors-Commercial Items. The proposal must demonstrate an understanding of all requirements covered in the RFP's terms and conditions. General statements that the offer can or will comply with the requirements, that standard procedures will be used, that well known techniques will be used, or paraphrases the RFP's Specifications in whole or in part will not constitute compliance with these requirements concerning the content of the technical proposal. Offerors will be evaluated in accordance with FAR 212-2, Evaluation-Commercial Items. The specific evaluation criteria under paragraph (a) of FAR 52.212-2 is: (1) price (2) technical capability of the item offered to meet NRL's need (3) past performance. Technical and past performance combined, are of equal importance compared to price. Offerors are advised to include with their offer a completed copy of the following provisions: FAR 52.212-3, Offeror Representations and Certifications-Commercial Items and DFARS 252.225-7000, Buy American Act-Balance of Payments Program Certificate. The following FAR clauses apply to this acquisition: FAR 52.212-4, Contract Terms and Conditions-Commercial items, FAR 52.212-5, Contract Terms and Conditions Required to Implement Statutes of Executive Orders-Commercial Items. The additional clauses that are applicable to this acquisition are FAR 52.203-6, FAR 52.203-10, FAR 52.219-8, FAR 52.222-26, FAR 52.222-35, FAR 52.222-36, FAR 52.222-37, FAR 52.225-3, FAR 52.225-18, and FAR 52.247-64. The clauses at DFARS 252.212-7001, Contract Terms and Conditions Required to Implement Statutes Applicable to Defense Acquisitions of Commercial Items, applies to this acquisition. The additional clauses cited applicable to this acquisition are DFARS 252.225-7001, DFARS 252.225-7007, DFARS 252.225-7012, DFARS 252.204-7004, and DFARS 252.232-7009. Any contract awarded as a result of this solicitation will be a DO rated order certified for national use under the Defense Priorities and Allocations System (DPAS) (15CFR 700). Any questions generated, as a result of this solicitation must be received no later than 10 days before the closing date. Original and two (2) copies of the Offerors proposal must be delivered to Contracting Officer, Bldg. 222, Rm. 115A, Naval Research Laboratory, Code 3220:JR, 4555 Overlook Ave. S.W. Washington, DC 20375-5326, and received no later than 4:00 p.m. E.S.T. on 30 January 1999. The package should be marked RFP N00173-99-R-JR01, Closing Date: 30 January 1999. For more information regarding this solicitation contact Jerry Riles, Contract Specialist at (202) 767-2120. All responsible sources may submit a proposal, which shall be considered by the agency. Synopsis number JR01. EMAILADD: Contracts.nrl.navy.mil EMAILDESC: <A HREF="mailto:Officer at the e-mail address</A>">Click here to forward a</A> request via e-mail Posted 12/11/98 (W-SN279715). (0345)

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