Naval Research Laboratory, Code 3220, 4555 Overlook Ave. S.W., Washington, D.C. 20375-5326

66 -- INSTRUMENTS AND LABORATORY EQUIPMENT SOL N00173-99-R-MS03 DUE 032699 POC Mary Sandy, Contract Specialist, Code 3220.MS, F. Janilea Bays, Contracting Officer, (202) 767-3710 WEB: click here, http://heron.nrl.navy.mil/contracts/home.htm. The purpose of this modification is to resend the combined synopsis/solicitation due to an error in item 17. The original synopsis/solicitation was posted in the CBD on 26 February 1999. This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. This solicitation number N00173-99-R-MS03, is issued as a request for proposal (RFP). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular 97-10 and Defense Acquisition Change Notice 19990101. This acquisition is 100% set a-side for small business. The small business size standard for this acquisition is 500 employees and the standard industry code (SIC) is 3825. The Naval Research Laboratory (NRL) has a requirement for a compact, portable, high-speed test system to characterize the effects of radiation on microelectronic devices at off-site facilities. CLIN 0001: Digital Test System, CLIN 0002: Semiconductor Parameter Analyzer. Optional Items: CLIN 0003: 16 Pin I/O card for the Digital Test System, CLIN 0004: 24 Pin Output/Address Card for the Digital Test System, CLIN 0005: Switch Matrix Card for the Semiconductor Parameter Analyzer. Description of Requirements: 1. The system must be portable. It is required that the entirety of the system, including controller, be sufficiently compact that all system components can be hand carried and/or checked as non-overweight or oversized luggage on commercial air carriers. Travel cases for said components are to be included in the system. 2. The system must be able to be operated remotely for use at facilities that have safety exclusion zones, such as UC Davis, without loss of performance (i.e. extending timing-critical cable lengths is inappropriate. Instead, operator interface extensions, or other accommodations should be used. 3.The system must have sufficient flexibility to test a variety of analog and digital devices under test (DUTs). Generally, for analog circuits, the ability to supply device power at different voltages, to monitor supply current, to source analog signals and to measure analog voltages is required. The resolution of these inputs and outputs are qualities, which will affect the desirability of system candidates. 4. At a minimum, for digital circuits, the ability to perform the above analog measurements as well as performing digital input and output (I/O) operations on, and otherwise exercising, in a time-effective manner, a variety of DUT types is paramount. Some examples of digital DUT types that must be testable are SRAM, DRAM, gate arrays and ASICS, microprocessors, digital signal processors and simple 'glue' logic. Ability to use different I/O logic voltage levels is a plus; alternatively, any provision for such translation is still useful. 5. The system must be programmable, in that user-configurable software should simplify test creation for new DUT types and be reconfigured as needed to test new devices. A reconfigurable, preferably graphical, user interface for simplification of test use is also required. Examples of acceptable user interface programmability are National Instruments' Labview or MS-VB, although others are acceptable. 6. The system must have an interface, or "test head", which removes the DUT from the equipment chassis by at least six feet. The test head must easily accommodate new DUT packages and pinouts. Specifically, proprietary, obsolete, or otherwise difficult-to connectors are not acceptable. The test head must be useable at facilities mentioned. The test head design must be such that it can be mounted in a high vacuum system. Continuous operation is in vacuum, and the ability to pass cabling through a vacuum bulkhead are required. 7. Adequate documentation is required for the operation of the system. Specifically, detailed schematics and mechanical description of the testhead, and like information on interface circuitry are mandatory, as well as software user-manual. 8. One day on-site training for five radiation effects personnel to be included. and unlimited applications-engineering assistance, via telephone, for the first year. Testing Capabilities (Digital Circuits) requirements: 1) The system must be capable of testing the effects of radiation on digital circuits. The effects include testing for Single Event Effects (including upset and latchup), functionality, and parametric characterization. The types of devices to be tested include: Memories: Static and/or Dynamic Random Access Memories (SRAMs, DRAMs): For example, 64 M DRAM; Application Specific Integrated Circuits (ASICs); Gate Arrays: For example, Actel 1280; Logic Circuits; Microprocessor/DSP: For example, ADSP21060; 2) Algorithmic Test Vector Generation; 3) Timing Requirement: The system must be capable of running test vectors at a clock speed of 50 MHz. 4) Pinout Requirements: The system must becapable to measure circuits with up to 256 pins. Testing Capabilities (Analog Circuits): 1) The system must have parametric testing of discrete components (e.g. transistors). 2) The system must have parametric testing of analog integrated circuits (e.g. operational amplifiers, voltage regulators etc.). 3) The system must have a minimum of four Source Measurement Units (SMUs) that can either force voltage and measure current, or force current and measure voltage in either a DC or pulse mode . It is desirable that the system be expandable to include additional SMUs. 4) The system must have at least two additional voltage sources. 5) The system must measure timing characteristics such as propagation delay. Delivery and Acceptance will be FOB Destination: Receiving Officer, Naval Research Laboratory, Bldg. 49, 4555 Overlook Avenue, SW, Washington DC, 20375-5320. Desired delivery date is May 1, 1999 based on the assumption that the Government will make award before or by March 30, 1999. Offerors are advised to propose in accordance with the provision FAR 52.212-1, Instructions to Offerors -- Commercial. Offerors will be evaluated in accordance with FAR 52.212-2, Evaluation-Commercial Items. The specific evaluation criteria under paragraph (a) of FAR 52.212-2 is (1) technical capability of the item offered to meet the Government requirement; (2) price; and (3) past performance. Technical and past performance, when combined, are of equal importance compared to price. Offerors must provide a completed copy of the provision FAR 52.212-3, Offeror Representations and Certification- Commercial Items with its offer which is available at http://heron.nrl.navy.mil/contracts/reps&;certs.htm. The following FAR clauses apply to this acquisition: FAR 52.212-4, Contract Terms and Conditions-Commercial Items, addenda to the clause FAR 52.217-7, and FAR 52.212-5, Contract Terms and Conditions Required to Implement Statues or Executive Orders-Commercial Items. The additional clauses cited under FAR 52.212-5 that are applicable to this acquisition are FAR 52.222-3, FAR 52.233-3, FAR 52.203-6, FAR 52.219-8, FAR 52.219-14, FAR 52.222-21, FAR 52.222-26, FAR 52.222-35, FAR 52.222-36, FAR 52.222-37, FAR 52.225-3, and FAR 52.239-1 The clause at DFARS 252.212-7001, Contract Terms and Conditions Required to Implement statutes or Executive Orders Applicable to Defense Acquisitions of Commercial Items applies to this acquisition. The additional clauses cited under DFARS 252.212-7001 that are applicable to this acquisition are: DFARS 252.225-7001, DFARS 252.225-7012, DFARS 252.227-7015, DFAS 252.227-7037, DFARS 252.243-7002, DFARS 252.247-7024, DFARS 252.225-7014, DFARS 252.204-7004 and DFARS 252.232-7009. The clause DFARS 252.212-7000, Offeror Representation and Certifications Commercial Items applies to this acquisition. Any contract awarded as a result of this solicitation will be a DO rated order certified for national use under the Defense Priorities an Allocations system (DPAS). Numbered Note 1 applies to this requirement. Offers must be delivered to: Contracting Officer, Code 3220.MS, Bldg. 222 Rm. 115, Naval Research Laboratory, 4555 Overlook Avenue, SW, Washington, DC 20375-5326. Offers must be received no later than 4:00 P.M. EST on 26 March 1999. The package should be marked: RFP N00173-99-R-MS03, Closing date 03/26/99 For additional information regarding this solicitation contact Mary Sandy, Contract Specialist, at (202) 767-3710. Any amendments to this solicitations will be published in the same manner as the initial synopsis/solicitations. Posted 03/01/99 (W-SN303276). (0060)

Loren Data Corp. http://www.ld.com (SYN# 0315 19990303\66-0009.SOL)