DOE/National Energy Technology Laboratory, P.O. Box 10940, MS 921-107, Pittsburgh, PA 15236-0940

66 -- JSPM-4200 SCANNING PROBE MICROSCOPE SOL 00M004482 DUE 072200 POC Mr. Robert L. Mohn, Contracting Officer, 412-386-4963, Tech Representive Mr. Bradley Bockrath, 412-386-6081 E-MAIL: mohn@netl.doe.gov, mohn@netl.doe.gov. DESC: This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 13.5, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. This solicitation number 005M04482 is issued as a Request for Quote (RFQ). Proposals are due July 22, 2000. This requirement is being issued as a Request for Quotation using Simplified Acquisition Procedures. The following items are to be purchased by the U.S. Department of Energy's National Energy Technology Laboratory (NETL), Pittsburgh, PA and is to be shipped to our site located in Pittsburgh, PA. (1) JSPM-4200 SCANNING PROBE MICROSCOPE consisting of the following -- Quantity 1 each; (1) Base Unit and Vibration Isolation: A. Air flotation vibration isolation table. B. Gel Damper for turbomolecular pump. C. Drift-free state design. D. +3 mm stage travel in XY. E. 5mm stage travel in Z, including 1.5mm stepper motor travel. F. Sample sizes up to 2 inches in XY, and 4mm in Z. G. Ports for gas inlet and outlet, vacuum pumping, cold stage, utility (2). H. Mounting point for optical microscope; (2) SPM Head: A. Capable of either STM or AFM operation, including simultaneous AFM feedback and current measurement. B. AFM optical lever arm detection modes include contact, non-contact, discrete contact ("tapping"), friction force microscopy, phase detection, current image (requires conductive cantilevers), magnetic force microscopy (requires magnetic cantilevers), and other detection modes using optional equipment. C. STM modes include STM, I-V, S-V, I-S and CITS. D. AFM cantilever holder, utilizes standard commercial AFM proves. E. STM tip holder, uses 0.3mm wire. (3) Scanner: A. 0 to 10 um scanning range guaranteed. B. Plus or Minus 150 Volt drive voltage. (4) Windows Controller: A. 4 inputs; X, Y, Z, Bias. B. 4 outputs; Aux1, Aux2, AFM, Z/10, 1 selectable. C. 16 bit digital XY resolution. D. 16 bit digital Z resolution. (5) Computer: High resolution 128Ox1024 2111 monitor, Mouse and keyboard operation, 400MHz Pentium or current model, 64MB RAM, 8MB SGRAM Video RAM, 512KB Cache, 4.3GB hard drive, SPM controller interface. (6) SPM Software for Windows: Windows3.X, Windows95 or Windows98 compatible. A. TIFF file format. B. File loading and searching. C. Standard Image processing functions. (a). Filters including FFT. (b). Edge enhancement. (c). Differentiation. (d). Normalizing. (e). Inclination correction. (f). Mathematical image operations. D. Standard Image Analysis Functions. (a) Height measurement. (b) Length measurement. (c) Line profiles. (d) FFT. (e) Surface roughness. (f) Particle analysis. (7) Installation in customer laboratory. (Installation requires the purchase of an optical microscope made by JOEL (OR EQUAL) TM-24011(AOM, and an amplifier for AFM system (OR EQUAL): TM-51551(AAMP2). (8) One year parts and labor warranty or more (begins with customers firs use of instrument). (9) Training on site. (10) One set of operation manuals. The salient specifications for the Scanning Probe Microscope (SPM) are as follows: (1) Design: The Scanning Probe Microscope (SPM) must be a state of the art computer controlled system. It must support imaging in a variety of environments including vacuum, ambient laboratory air, controlled gases, and under fluids. The SPM must have the ability to heat the sample from room temperature to 800K and acquire data in that temperature range. The SPM must have the ability to cool the sample from room temperatures to 130K and acquire data in that temperature range. The SPM must have integrated vibration isolation sufficient to achieve atomic resolution on suitable test samples such as highly ordered pyrolitic graphite (HOPG) or mica. (2) Performance: Minimum requirements: (A) The SPM shall be capable of achieving atomic resolution on appropriate, ordered surfaces. This requirement includes integrated vibration isolation. Surfaces for testing this capability include HOPG and mica. The SPM shall be capable of achieving step height resolution of one atomic or molecular layer on appropriate, layered surfaces. Surfaces for testing this capability include epitaxial gold, HOPG, and mica. (B) The SPM shall be capable of operating as both a scanning tunneling microscope (STM) and as an atomic force microscope (AFM). (C) The SPM shall be able to operate in the following STM modes: tunneling microscopy (STM), tunneling spectroscopy (STS), and current imaging tunneling spectroscopy (CITS). (D) The SPM shall be able to operate in the following AFM modes: static (contact) mode, dynamic (non-contact and discrete contact or "tapping"), phase detection (PDM), magnetic force (MFM), electric force (EFM), Kelvin Probe (KPM), and force modulation (FMM). (E) The SPM shall be able to acquire data while the sample is heated to 800K or cooled to 130K. (F) The SPM shall be able to acquire data while the sample is under vacuum, controlled gases, ambient air, or under fluids. (G) The SPM shall be computer controlled and the control software must work within the Windows95/98 operating system. (3) SPM tips: (A) The SPM must be capable of using commercially available AFM cantilevers. and (B) The SPM must be capable of using etched 0.3mm tungsten or platinum-iridium wire as STM tips. (4) Specimen state: (A) The SPM must have a stage that is capable of plus or minus 3mm of travel in the XY plane. (B) The SPM must have a stage that is capable of 5mm of total travel in the Z plane. (C) The SPM must be able to accommodate samples that are up to 50mm in diameter and 3mm thick. (D) The stage must have provisions for vacuum evacuation. (E) The stage must have provisions for heating the sample in the range from room temperature to 800K. (F) The stage must have provisions for cooling the sample in the range from room temperature to 130K. and (G) The stage must have provisions for the introduction of controlled gases in the sample region. DELIVERY: Equipment must be received no later than July 31, 2000 and FOB Destination is required (all freight included). FAR 52.212-1 Instructions to Offerors -- Commercial Items (AUG 1998) is incorporated by reference and applies to this acquisition. Within FAR 52.212-1, an reference to "offer" is changed to read as "quote". The provisions at 52.212-2 Evaluation -- Commercial Items (JAN 1999) does not apply to this acquisition. Instead, the following information will be used for evaluation of offerors: An award shall be made to the responsible offeror submitting a technically acceptable quote and offering the lowest evaluated price. Evaluation is based on best value including cost and ability to meet stated requirements above. Offerors shall submit descriptive literature and drawings detailing features, technical capabilities and warranty data. Technical acceptability will be determined solely on the content and merit of the information submitted response to this provision as it compares to the minimum characteristics provided above. Therefore, it is essential that offerors provide sufficient technical literature, documentation, etc., in order for the Government evaluation team to make an adequate technical assessment of the quote as meeting technical acceptability. Price shall be the deciding factor among technically acceptable quotes. The offeror shall provide backup information to support the quoted prices (e.g. a copy of current catalog or established price list, etc.). FAR 52.212-3 Offeror Representation and Certifications -- Commercial Items, FAR 52.214-4 Contract Terms and Conditions -- Commercial Items, and FAR 52.2121-5 Contract Terms and Conditions Required to implement Statutes or Executive Orders -- Commercial Items apply to this acquisition. FAR provisions and clauses including FAR 52.222-37, Employment Reports on Disabled Veterans and Veterans of the Vietnam ERA, it has ( ), has not( ) submitted the most recent report required by 38 U.S.C. 4212(d). (B) An Offeror who checks "has not" may not be awarded a contract until the required reports are filed. (31 U.S.C. 1354). ALL INTERESTED PARTIES SHALL SUBMIT OFFERS WITH THE FOLLOWING INFORMATION: Federal Tax Identification (TIN); Dun & Bradstreet Number (DUNS); remit to address if different; and business size. EVALUATION: The following factors shall be used to evaluate offers in order or precedence: Technical compliance with the specifications of this RFQ and cost. 52.212-3, Offeror Representation and Certifications -- Commercial Items; and 52.212-4, Contract Terms and Conditions. A Firm Fixed Priced Purchase Order shall be issued using the Simplified Acquisition Procedures FAR Part 13. Proposals may be faxed to Mr. Robert L. Mohn, 412-386-5770. See Note 26 Posted 07/06/00 (W-SN471871). (0188)

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