66 -- NANOMECHANICAL TEST INSTRUMENT

Notice Date

September 5, 2001

Contracting Office

NASA/Goddard Space Flight Center, Code 215, Greenbelt, MD 20771

ZIP Code

20771

Solicitation Number

541-30513-920

Response Due

September 21, 2001

Point of Contact

Mary E. McKaig, Contract Specialist for Simplified Acquisition, Phone (301) 286-4240, Fax (301) 286-1720, Email Mary.E.McKaig.1@gsfc.nasa.gov

E-Mail Address

Mary E. McKaig (Mary.E.McKaig.1@gsfc.nasa.gov)

Description

NASA/GSFC plans to issue a Request for Quotation (RFQ) for the purchase of a nanomechanical test instrument. This procurement is being conducted under the Simplified Acquisition Procedures (SAP). NASA/GSFC intends to purchase the items on a sole-source basis from Hysitron, Inc., in Minneapolis, MN, under the authority of FAR 6.302-1, 10 U.S.C. 2304(c)(1), Only One Responsible Source. The product to be acquired will mount directly onto an existing scanning probe microscope (SPM) allowing quantitative mechnical testing of materials on the nanometer scale. The nanomechanical test instrument must possess the following minimum requirements: 1) be totally compatible and easily integratable with the Digital Instrument's Dimension Series 3000 SPM instrument hardware and utilize the existing scanning software; 2) perform both atomic force imaging and nanoindentation with only one probe tip to allow precision positioning of the indents on a nanometer scale as well as immediate pre- and post-scanning of the material surface with angstrom scale resolution. Nanomechanical test equipment that images and indents the material with two separate probe tips (one for imaging and one for indenting) is unacceptable because of the lower accuracy and precision of the data; 3) exhibit a load resolution of at least 1 nm and Z-axis displacement resolution of at least 0.0002 nm; 4) utilize electrostatic force actuation of the nanoindenter tip; and 5) display a topographical atomic force image of the material surface covering a lateral area of at least 80 um x 80 um. An extensive market search identified only two companies based in the U.S. that produce nanomechanical test equipment. Of these two companies, only the instrument from Hysitron, Inc., utilizes a single probe tip to perform both functions of producing atomic force images as well as making nanoindentations on the material surface when coupled to a SPM. This innovation significantly increases the accuracy and precision of its nanomechanical tests. In addition, the instrument from Hysitron, Inc., is compatible with the type of SPM already owned by the Government. It is also easily ingratable with the SPM hardware and utilizes the existing scanning software of the SPM. No other U.S. company markets a device of this type. The Government intends to acquire a commercial item using FAR Part 12. Interested organizations may submit their capabilities and qualifications with respect to being able to provide such a device in writing to the identified point of contact on or before 4:30 p.m. local time on Friday, September 21, 2001. Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice is solely within the discretion of the government. Oral communications ARE NOT acceptable in response to this notice. All responsible sources may submit an offer which shall be considered by the agency. An Ombudsman has been appointed. See NASA Specific Note "B". Any referenced notes can be viewed at the following URL: http://genesis.gsfc.nasa.gov/nasanote.html

Web Link

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Record

Loren Data Corp. 20010907/66SOL016.HTM (D-248 SN50W7U5)