70 -- EDAX UPGRADE SYSTEM PHOENIX PACKAGE

Notice Date

September 10, 2001

Contracting Office

NASA/Glenn Research Center, 21000 Brookpark Road, Cleveland, OH 44135

ZIP Code

44135

Solicitation Number

RFQ185031

Response Due

September 17, 2001

Point of Contact

Alice J. Wilson, Contract Specialist, Phone (216) 433-2552, Fax (216) 433-5489, Email Alice.J.Wilson@grc.nasa.gov

E-Mail Address

Alice J. Wilson (Alice.J.Wilson@grc.nasa.gov)

Description

NASA/GRC plans to issue a Request for Quotation (RFQ) for: QTY. 1 COMPUTER AND ANALYZER HARDWARE a. The system shall be exclusively PC-based, utilizing the Microsoft Windows-2000 operating system. Sun workstations or Unix-based hardware, either direct or embedded, are not acceptable. b. System will include, at a minimum, a 1.4 Ghz PentiumIV Workstation, 3.5" 1.44Mb floppy disc drive, read-write CD-ROM, 256Mb CPU memory, 40Gb Hard Drive, Ethernet, 17" monitor and a Hewlett Packard 1220 inkjet printer (or equivalent). c. The data acquisition electronics will be housed in an external module and include digital pulse processing, digital signal processing and a dedicated PCI-bus architecture for transferring data to the PC workstation. d. The analyzer will provide for eight user-selectable amp times, and three selectable settings for the spectrometer resolution (eV per channel). e. The analyzer shall include all components necessary to assume beam control and collect images via its own scan generator for x-ray mapping and digital imaging. There shall be a minimum of four ADC inputs with the capability to accept signals from an x-ray detector, a secondary electron detector, a back-scattered electron detector or any combination thereof. f. The analyzer shall be able to interface to the existing EDAX ECON IV X-ray detector on the JEOL 840 SEM without compromise. The electronics in the analyzer must be able to directly interface to the detector without the need for any additional units between them. The system application software must be able to recognize the EDAX ECON IV detector window, crystal materials, and complete detector specifications for proper use of the algorithms in the software that utilize this information. APPLICATIONS SOFTWARE g. The system shall utilize modern, 32-bit application software written specifically for Windows 2000. Unix-developed software specially compiled to run under Windows or software running under emulation in Windows (e.g. within third party applications such as Exceed.) is not acceptable. h. All applications should be available from a single window. i. Data such as spectra and images should be shared amongst applications j. The system shall have a remote version of the software available for data display and reduction. k. The system will include automatic and manual peak identification. Manual peak identification shall be accomplished via elemental symbol, atomic number, Z+, Z-, and/or cursor position. l. User selectable peak labeling filters will include alpha lines only, element, shell and transition options. m. The system will include a graphical method for separating and identifying complicated peak overlaps (deconvolution and peak stripping), via graphical halo technique. n. There will be a fully accessible and correctable Energy and Periodic Table available with weight composition, Ave Z, Ave density and other calculations available. o. Sum peak, escape peaks, and absorption edge markers can be displayed with spectrum. p. The system shall provide for true standardless quantitative analysis, independent of beam current and without referencing any previously collected pure or compound reference standards whatsoever. q. The system shall employ PhiZAF algorithms for standardless quantitative analysis. r. Standardized quantitative analysis shall be provided for utilizing pure or compound references, the latter including the use of overlapping peaks. s. Software shall include advanced peak modeling software via a graphical halo technique. t. Background shall be automatically computed and displayed during quantitative analysis within the original window of the spectrum with peak ID. u. Manual, point-to-point background selection (Kramer method) with progressive curve fitting, scaling and subtraction shall also be provided. v. The system will include Microsoft Windows Office 2000 Package. w. Digital images and maps will have an aspect ratio similar to the SEM camera, not a square format, with resolution selectable from 64 x 50 to 4096 x 3200 pixels. x. Spectral acquisition shall be possible in the imaging software, within a field of view, and include full frame, reduced raster and spot modes. y. Qualitative functions shall be identical to those listed above: auto/manual peak identification, a graphical method for separating and identifying complicated peak overlaps (deconvolution and peak stripping), via graphical halo technique. z. X-ray maps shall be collected using region of interest (ROI) data, with matrix resolution selectable from 64 x 50 up to 2048 x 1600. Other user selectable features will include dwell times from 1 to 2000 ms, element map color, and eight time constants. A calculated collection time and image file size shall be displayed as parameters are varied. aa. The system shall have the capability to overlay any selection of 2 to 6 X-ray maps. bb. In addition to ROI mapping, the system shall include the capability to acquire x-ray maps using net intensity; K-ratio or ZAF corrected weight percentages on the fly. cc. The system will have automatic prompting if the x-ray count rate is insufficient for quality mapping data. dd. The System shall have the capability of acquiring spectral data at every point in the image via a spectral mapping routine. The data may be easily re-analyzed from selected area within the image. ee. The system shall have the capability of analyzing images and providing image analysis based on morphology and / or grey level interpretations of the image. It shall also be able to provide chemical information from the selected morphology and/or grey level criteria and all information shall be available in Excel spreadsheet format. ff. The system shall have the capability of acquiring data from images in selected point or matrix areas from the image. All acquisitions may be automated for point to point collection and subsequent analysis. INSTALLATION, DOCUMENTATION TRAINING, AND WARRANTY a. Complete installation of the analyzer, software and associated hardware (i.e. cabling) to the SEM shall be furnished by the x-ray microanalysis system manufacturer, and included in the system price. b. Initial operating procedures will be covered by the service person at the time of installation. c. A credit for one person to attend a factory training school shall be included with the x-ray microanalysis system. d. A complete set of user manuals will be included with each system to be delivered at the time of installation. e. The system shall be warranted against defects due to manufacture and workmanship for a period of one year from the date of installation. The warranty liability shall be limited to the repair or replacement (and Engineer's travel and boarding cost, and labor) of any defective product, provided such a defect is not the result of misuse or abuse on the part of the user. f. The manufacturer will guarantee a minimum of 92% system up time during warranty and service contract period. In the event that the system is down more than 8% in any given year, the customer will be credited one month extended service contract for each week the system is down. This procurement is being conducted under the Simplified Acquisition Procedures (SAP). NASA/GRC intends to purchase the items from EDAX INC., 91 McKee Drive, Mahwah, NJ 07430-0000. THE AUTHORITY FOR OTHER THAN FULL AND OPEN COMPETITION is U.S.C. 2304(c)(2). GRC currently uses an EDAX ECON IV SiLi Crystal on the JEOL 840 SEM (ECN 1068874) that was purchased from EDAX Inc. to interface with the JEOL SEM video to perform X-ray imaging and microanalysis. The existing equipment needs to be upgraded to a more reliable, state-of-the-art system that can meet GRC's various programmatic needs. The manufacturer must be the same as the existing EDAX ECON IV SiLi Crystal detector to allow for direct connection and electronic interface without compromising the performance of the detector. The Government intends to acquire a commercial item using FAR Part 12. Interested organizations may submit their capabilities and qualifications to perform the effort in writing to the identified point of contact not later than 4:30 p.m. local time on Monday, September 17, 2001. Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice is solely within the discretion of the government. Oral communications are acceptable in response to this notice. All responsible sources may submit an offer which shall be considered by the agency. OMBUDSMAN STATEMENT REQUIRED] An Ombudsman has been appointed. See NASA Specific Note "B". Any referenced notes can be viewed at the following URL: http://genesis.gsfc.nasa.gov/nasanote.html

Web Link

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Record

Loren Data Corp. 20010912/70SOL013.HTM (D-253 SN50X2C4)