SOURCES SOUGHT
A -- JPL CIRCUIT TO SYSTEM RELIABILITY MODEL REQUEST FOR INFORMATION
- Notice Date
- 2/9/2010
- Notice Type
- Sources Sought
- NAICS
- 336414
— Guided Missile and Space Vehicle Manufacturing
- Contracting Office
- NASA Management Office, Jet Propulsion Laboratory, 4800 Oak Grove Drive,Pasadena, CA 91109
- ZIP Code
- 91109
- Solicitation Number
- PB-10-02
- Response Due
- 3/3/2010
- Archive Date
- 2/9/2011
- Point of Contact
- Mary Helen Ruiz, JPL Business Opportunities Office, Phone 818-354-7532, Fax 818-393-1746, Email maryhelen.ruiz@jpl.nasa.gov
- E-Mail Address
-
Mary Helen Ruiz
(maryhelen.ruiz@jpl.nasa.gov)
- Small Business Set-Aside
- N/A
- Description
- The California Institute of Technology's Jet Propulsion Laboratory, located inPasadena, California, operating under a prime contract with NASA seeks potentialcontractors to support or provide analysis capability at the circuit and system levelincorporating part level test data and uncertainties to better assess risk in support ofthe Jupiter Europa Orbiter (EJSM) mission. It is hoped that tools or services can bedeveloped or contracted to the JEO mission. Organizations supporting these activities mayalso wish to present the capabilities and services at the Instrument Workshop in July ofthis year. BACKGROUND:NASA has prioritized the Jupiter Europa Orbiter project as thenext flagship outer-planets mission. The JEO spacecraft will be subjected to greatertotal ionizing dose (TID) radiation than any previous mission, up to about 3.0 Mega-radsbehind 100 mils of aluminum. While existing shielding techniques provide means to reducethe part TID exposure to hundreds of Kilo-rads, it is hoped to minimize the spacecraftshielding mass via appropriate techniques. Consequently, it is anticipated that a greaterdepth of part and circuit modeling and analysis will be required for some critical flightelectronics designs than has previously been performed for NASA outer planet missions.This analysis will include engineering models of part parameter variations as influencedby radiation, age, temperature, and possibly initial tolerance; combining the partparameter models into circuit level models; determining circuit performance; andcombining probabilistic circuit performance information for critical circuits to assesssystem lifetime. Where this approach varies significantly from previous analysesperformed for outer planet missions is that this effort will include probabilistic data. The models for part parameter variation will incorporate supporting statistical data frompart tests. Circuit models will address the combination of the statistically-based partmodel parameters, and the underlying uncertainties associated with them, in deriving thecircuit performance as a probability density function over the range of possibleoutcomes. Circuits or representative models of circuits are combined to form subsystems,and subsystems to form systems (power, C&DH, telecon, etc.) Given the nature of the highTID exposure, the part models should provide estimates of parametric performance vs. TID,as well as temperature and aging. Ideally, these models should include the effects ofany coupling between the influence of these environmental factors: for example, theextent to which high temperature operation exacerbates (or mitigates) the effect ofradiation. As such, it is expected that the generation of such models with requireradiation testing of parts, to either generate wholly empirical models of the parts, orto verify physics-based models. The overall system performance will include the circuitelements that contribute risk at various lifetimes analyzed, and the interaction of thosecircuits with each other to determine subsystem performance. At the circuit level and atthe system level results will include the likelihood of failure with respect to specifiedperformance criteria (e.g., limits of output for a circuit) at given points in themission timeline (e.g., Europa Orbit Insertion EOI, EOI + 105 days, EOI + 180 days, EOI+ 270 days, etc). New or different tools may be required or an effective means needed toextend and/or adapt existing electronic circuit simulation tools to process the modelsdescribed above, and produce the requisite outputs. The results will be risk oriented. Ananalytical capability is required to determine risk drivers at the circuit to systemlevel. This type of sensitivity analysis will provide insight into which parts, circuits,and subsystems are driving overall system reliability and risk. At the circuit level theywill indicate the risk contribution of the different parts. For each part the salientcontributors to its unreliability (e.g., aging over the long mission or TID). Inaddition, the circuit performance will be quantitatively ranked relative to their impacton circuit reliability, in an attempt to determine the risk drivers, i.e., sensitivity tooverall reliability. At the system level they will indicate the risk contributions of thecircuits included in the system model and the environmental conditions. This informationwill be used as the basis of decisions regarding testing to obtain better part data andreduce uncertainty, redesign, and allocation of resources (e.g., part shielding materialsto reduce radiation degradation at a particular location). The tool, or tool set, thatprovides this capability is anticipated to be simulation based. As such appropriateconvergence criteria will have to be developed and demonstrated on it for calculations atthe circuit and system levels to establish that it will provide acceptably accurate andtimely results. The envisaged simulation will not combine part failure probabilities intocircuit failure probabilities, and then combine circuit failure probabilities into systemfailure probabilities using conventional fault tree or reliability block diagramtechniques. At the circuit level, for example, we want to quantify the circuit failureprobability as the probability that the circuit is unable to satisfy its performancerequirements. At the subsystem and system level, we want to quantify the probability, forexample, that the power or telecom (sub)system is unable to operate within itsperformance range. Engineers invariably incorporate margins into their designs, (from thepart to the system level), so even if some elements are operating beyond theirperformance specifications the circuit may still satisfy its performance requirements. Thus, conventional definitions of part failure are incompatible with the simulationsneeds. It is anticipated that the circuit and system models will require simplificationsto keep the size of the models practical. The tool, or tool set, must have thiscapability. PURPOSE: JPL is interested in receiving information from organizations withexisting processes and/or tools that perform some or all of these analysis steps usingstatistical data to characterize parts and to model circuit and system performance. Itis anticipated that the complexity and resources involved in developing this analysistool set will preclude development from scratch and that JPL will need to use an existingtool if such is available or else incorporate several tools that provide solutions toportions of the needed technology and then develop the remaining elements. Contractorsare urged to provide practical examples of the extent to which analysis tools are used toassess circuit, subsystem, and system risk including dealing with uncertainty issues. Theplatform used for any simulation algorithms and the process and time required todetermine that convergence has been reached should be discussed. RESPONSE TO THE RFI:Please provide your response including the following requirements: (1) Company name andmailing address; (b) Contact person, phone, FAX number, and Email address; and (2)Company size (i.e., large business, small business, small disadvantaged business,woman-owned, Service-Disabled/Veteran owned, etc.) Please limit your written response toten (10) pages. RESPONSE DEADLINE: Please submit the above-requested information to theattention of Mary Helen Ruiz at Email address: maryhelen.ruiz@jpl.nasa.gov no later thanWednesday, March 3, 2010. POINT OF CONTACT: Please direct any questions regarding thissynopsis to Paul Bowerman via Email to: paul.n.bowerman@jpl.nasa.gov DISCLAIMER: It isemphasized that the requested information is for preliminary planning purposes only anddoes not constitute a commitment, implied or otherwise, that JPL will solicit procurementin the future.Neither JPL nor the Government will be responsible for any costs incurredby you in furnishing this information.Be advised that any information provided shall bedeemed to be furnished with unlimited rights to JPL, with JPL assuming no liability forthe disclosure, use, or reproduction of such data.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/NASA/HQ/OPHQDC/PB-10-02/listing.html)
- Record
- SN02061715-W 20100211/100209235043-557dc4d9331d91e7f67d65c70f6f80cd (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
| FSG Index | This Issue's Index | Today's FBO Daily Index Page |